Evaluation of an Electric Field over Sample Surfaces by Electron Standing Waves in a Vacuum Gap of Scanning Tunneling Microscopy

Electric field intensities over sample surfaces have been evaluated from peak intervals of differential conductance oscillation due to electron standing waves, which are excited in a vacuum gap of scanning tunneling microscopy. By comparing the intervals measured for different samples of Au(111), Si...

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Veröffentlicht in:Japanese Journal of Applied Physics 2000-06, Vol.39 (6S), p.3758
Hauptverfasser: Yoshinori Suganuma, Yoshinori Suganuma, Masahiko Tomitori, Masahiko Tomitori
Format: Artikel
Sprache:eng
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Zusammenfassung:Electric field intensities over sample surfaces have been evaluated from peak intervals of differential conductance oscillation due to electron standing waves, which are excited in a vacuum gap of scanning tunneling microscopy. By comparing the intervals measured for different samples of Au(111), Si(111), Si(001) and Ge(001) with tips of similar radius, we have demonstrated that the electric field intensities are different on these surfaces. This study provides a new method to evaluate the electric field near surface regions on a nanometer scale.
ISSN:0021-4922
1347-4065
DOI:10.1143/JJAP.39.3758