Evaluation of an Electric Field over Sample Surfaces by Electron Standing Waves in a Vacuum Gap of Scanning Tunneling Microscopy
Electric field intensities over sample surfaces have been evaluated from peak intervals of differential conductance oscillation due to electron standing waves, which are excited in a vacuum gap of scanning tunneling microscopy. By comparing the intervals measured for different samples of Au(111), Si...
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Veröffentlicht in: | Japanese Journal of Applied Physics 2000-06, Vol.39 (6S), p.3758 |
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Hauptverfasser: | , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
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Zusammenfassung: | Electric field intensities over sample surfaces have been evaluated
from peak intervals of differential conductance oscillation due to electron
standing waves, which are excited in a vacuum gap of scanning tunneling microscopy.
By comparing the intervals measured for different samples of Au(111),
Si(111), Si(001) and Ge(001) with tips of similar radius, we have
demonstrated that the electric field intensities are different on these
surfaces. This study provides a new method to evaluate the electric field
near surface regions on a nanometer scale. |
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ISSN: | 0021-4922 1347-4065 |
DOI: | 10.1143/JJAP.39.3758 |