Monte Carlo Simulation of Generations of Continuous and Characteristic X-Rays by Electron Impact

A new Monte Carlo (MC) simulation code has been developed to describe the spectra of not only continuous X-rays but also characteristic X-rays. The simulation code is developed using the Kirkpatrick-Wiedmann-Statham equation and the formulae derived by Casnati and Gryzinski to describe generations of continuous X-rays and characteristic X-rays, respectively. The results indicate that a series of experimental X-ray spectra from W films of different thickness on Cu substrates have been reproduced by the present MC simulation with considerable success. A practical application for designing the optimum construction of a rotor-type X-ray source is also presented.