Continuum X-Ray Generation from W Film on Cu Substrate
The dependence of the continuum X-ray generation from a W film on the primary energy (15 to 30 keV) and film thickness (0.1 to 0.7 µm) have been investigated by experiment and Monte Carlo (MC) simulation in order to develop a high-power rotor-type X-ray source of high efficiency. The continuum X-ray...
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Veröffentlicht in: | Japanese Journal of Applied Physics 2000-03, Vol.39 (3R), p.1418 |
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Hauptverfasser: | , , , , , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | The dependence of the continuum X-ray generation from a W film
on the primary energy (15 to 30 keV) and film thickness (0.1 to
0.7 µm) have been investigated by experiment and Monte Carlo
(MC) simulation in order to develop a high-power rotor-type
X-ray source of high efficiency. The continuum X-ray spectra
obtained by MC simulation show excellent agreement with the
experimental data, confirming the fact that the present MC
simulation is applicable for a systematic study to optimize the
construction of an X-ray source. The dependence of the continuum
X-ray generation on the thickness of the W film has revealed that
the continuum X-ray spectra from the W film of thickness
∼0.7 µm are almost similar to those of the bulk W in the
investigated range of primary energies. This indicates that the
thickness of the W film of ∼0.5 µm is sufficient for the
rotor-type X-ray source, although a commercial-type source is of the
order of hundreds µm with the primary energy of ∼50 keV. |
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ISSN: | 0021-4922 1347-4065 |
DOI: | 10.1143/JJAP.39.1418 |