Continuum X-Ray Generation from W Film on Cu Substrate

The dependence of the continuum X-ray generation from a W film on the primary energy (15 to 30 keV) and film thickness (0.1 to 0.7 µm) have been investigated by experiment and Monte Carlo (MC) simulation in order to develop a high-power rotor-type X-ray source of high efficiency. The continuum X-ray...

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Veröffentlicht in:Japanese Journal of Applied Physics 2000-03, Vol.39 (3R), p.1418
Hauptverfasser: Obori, Kenichi, Yurugi, Toshikazu, Ding, Ze-jun, Nagatomi, Takaharu, Fujii, Kentarou, Kimura, Yoshihide, Shimizu, Ryuichi
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Sprache:eng
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Zusammenfassung:The dependence of the continuum X-ray generation from a W film on the primary energy (15 to 30 keV) and film thickness (0.1 to 0.7 µm) have been investigated by experiment and Monte Carlo (MC) simulation in order to develop a high-power rotor-type X-ray source of high efficiency. The continuum X-ray spectra obtained by MC simulation show excellent agreement with the experimental data, confirming the fact that the present MC simulation is applicable for a systematic study to optimize the construction of an X-ray source. The dependence of the continuum X-ray generation on the thickness of the W film has revealed that the continuum X-ray spectra from the W film of thickness ∼0.7 µm are almost similar to those of the bulk W in the investigated range of primary energies. This indicates that the thickness of the W film of ∼0.5 µm is sufficient for the rotor-type X-ray source, although a commercial-type source is of the order of hundreds µm with the primary energy of ∼50 keV.
ISSN:0021-4922
1347-4065
DOI:10.1143/JJAP.39.1418