Evaluation of Interface States in ZnO Varistors by Spectral Analysis of Deep Level Transient Spectroscopy

Evaluation of Interface States in ZnO Varistors by Spectral Analysis of Deep Level Transient Spectroscopy

Interface states in ZnO varistors were studied using spectral analysis of deep level transient spectroscopy (SADLTS) to obtain the emission rate spectrum. We found one interface state in ZnO with the activation energy and the capture cross section distributed around their central values, E 0 =0.98 e...

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Veröffentlicht in:Japanese Journal of Applied Physics 1999, Vol.38 (2R), p.899
Hauptverfasser: Ohbuchi, Yasuhiro, Yoshino, Junya, Okamoto, Yoichi, Morimoto, Jun
Format: Artikel
Sprache:eng
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Zusammenfassung:Interface states in ZnO varistors were studied using spectral analysis of deep level transient spectroscopy (SADLTS) to obtain the emission rate spectrum. We found one interface state in ZnO with the activation energy and the capture cross section distributed around their central values, E 0 =0.98 eV and σ 0 =1.8×10 -16 cm 2 , over widths Δ E =0.19 eV and Δσ=2.9×10 -17 cm 2 , respectively.
ISSN:0021-4922
1347-4065
DOI:10.1143/JJAP.38.899