Thermally Optimum Structure for Overwriting Cyclability and Cross-Erase Characteristics

As two key restrictions for increasing the recording capacity, cross-erase and jitter from narrowing track pitch (0.55 µm–0.6 µm) and making small marks (0.40 µm–0.62 µm) are presented using a thermally optimum phase-change optical disk with the ability of thermal endurance and high thermal conducti...

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Veröffentlicht in:Japanese Journal of Applied Physics 1999, Vol.38 (3S), p.1705
Hauptverfasser: Lee, Kyung-Geun, Yoon, Du-Seop, Kim, Sung-Su, Roh, Myung-Do, Whang, In-O, Park, Chang-Min, Kim, Yoon-Gi, Park, Seung-Han
Format: Artikel
Sprache:eng
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Zusammenfassung:As two key restrictions for increasing the recording capacity, cross-erase and jitter from narrowing track pitch (0.55 µm–0.6 µm) and making small marks (0.40 µm–0.62 µm) are presented using a thermally optimum phase-change optical disk with the ability of thermal endurance and high thermal conduction as well as minimum crosstalk and maximum groove signals. For overwriting jitter no increase after 10 4 cycles is observed. The cross erase after 10 4 overwriting cycles resulted in less than 1% of jitter increase from the initial value.
ISSN:0021-4922
1347-4065
DOI:10.1143/JJAP.38.1705