Physical Properties of Heavily B-doped Microcrystalline Si–Ge Alloys and Schottky Barrier of B–Si–Ge/P-Si
The heavily B-doped microcrystalline Si–Ge alloy was prepared for the density of B atoms of the order of 1 at.%. The hopping conduction due to localized states near the valence band edge is observed. The presence of localized states increases the disorder effect due to B - atoms. The heavily B-doped...
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Veröffentlicht in: | Japanese Journal of Applied Physics 1998-10, Vol.37 (10R), p.5708 |
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Hauptverfasser: | , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | The heavily B-doped microcrystalline Si–Ge alloy was prepared
for the density of B atoms of the order of 1 at.%. The hopping
conduction due to localized states near the valence band edge is
observed. The presence of localized states increases the disorder
effect due to B
-
atoms. The heavily B-doped µc Si–Ge has the
enhanced optical absorption at lower photon energy side than the
band-gap energy of poly SiGe. This was explained semi quantitatively
by this disorder effect. A microcrystalline B–Si–Ge/P-Si
Schottky barrier was fabricated. The dependence of
the barrier potential on Si composition agrees with the
Cowely-Sze theory, which can be applied to a metal-Si Schottky
barrier with a native oxide. |
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ISSN: | 0021-4922 1347-4065 |
DOI: | 10.1143/JJAP.37.5708 |