Physical Properties of Heavily B-doped Microcrystalline Si–Ge Alloys and Schottky Barrier of B–Si–Ge/P-Si

The heavily B-doped microcrystalline Si–Ge alloy was prepared for the density of B atoms of the order of 1 at.%. The hopping conduction due to localized states near the valence band edge is observed. The presence of localized states increases the disorder effect due to B - atoms. The heavily B-doped...

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Veröffentlicht in:Japanese Journal of Applied Physics 1998-10, Vol.37 (10R), p.5708
Hauptverfasser: Osaka, Yukio, Kohno, Kenji, Tanabe, Yukiya
Format: Artikel
Sprache:eng
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Zusammenfassung:The heavily B-doped microcrystalline Si–Ge alloy was prepared for the density of B atoms of the order of 1 at.%. The hopping conduction due to localized states near the valence band edge is observed. The presence of localized states increases the disorder effect due to B - atoms. The heavily B-doped µc Si–Ge has the enhanced optical absorption at lower photon energy side than the band-gap energy of poly SiGe. This was explained semi quantitatively by this disorder effect. A microcrystalline B–Si–Ge/P-Si Schottky barrier was fabricated. The dependence of the barrier potential on Si composition agrees with the Cowely-Sze theory, which can be applied to a metal-Si Schottky barrier with a native oxide.
ISSN:0021-4922
1347-4065
DOI:10.1143/JJAP.37.5708