Thermodynamic analysis on Molecular Beam Epitaxy of GaN, InN and AlN
A chemical equilibrium model is applied to the Molecular Beam Epitaxy (MBE) growth of GaN, InN and AlN semiconductors using atomic nitrogen and NH 3 sources. The equilibrium partial pressure and the growth rate are calculated for each of the following parameters: input V/III ratio, input partial pre...
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Veröffentlicht in: | Japanese Journal of Applied Physics 1997-06, Vol.36 (6B), p.L750-L753 |
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creator | KOUKITU, A SEKI, H |
description | A chemical equilibrium model is applied to the Molecular Beam Epitaxy (MBE) growth of GaN, InN and AlN semiconductors using atomic nitrogen and NH
3
sources. The equilibrium partial pressure and the growth rate are calculated for each of the following parameters: input V/III ratio, input partial pressure of group III elements and growth temperature. A phase diagram for the deposition, indicating etching, droplet and growth regions, is computed for the growth of III–V nitrides. Based on the diagram, the growth condition suitable for the MBE growth of III–V nitrides is predicted. |
doi_str_mv | 10.1143/jjap.36.L750 |
format | Article |
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3
sources. The equilibrium partial pressure and the growth rate are calculated for each of the following parameters: input V/III ratio, input partial pressure of group III elements and growth temperature. A phase diagram for the deposition, indicating etching, droplet and growth regions, is computed for the growth of III–V nitrides. Based on the diagram, the growth condition suitable for the MBE growth of III–V nitrides is predicted.</description><identifier>ISSN: 0021-4922</identifier><identifier>EISSN: 1347-4065</identifier><identifier>DOI: 10.1143/jjap.36.L750</identifier><identifier>CODEN: JJAPA5</identifier><language>eng</language><publisher>Tokyo: Japanese journal of applied physics</publisher><subject>Cross-disciplinary physics: materials science; rheology ; Exact sciences and technology ; Materials science ; Methods of deposition of films and coatings; film growth and epitaxy ; Molecular, atomic, ion, and chemical beam epitaxy ; Physics</subject><ispartof>Japanese Journal of Applied Physics, 1997-06, Vol.36 (6B), p.L750-L753</ispartof><rights>1997 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c410t-26c8643e949e4a291fe18ef5b35ddc1d67941fa8203afc84e4c6674c4fdacaac3</citedby><cites>FETCH-LOGICAL-c410t-26c8643e949e4a291fe18ef5b35ddc1d67941fa8203afc84e4c6674c4fdacaac3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=2719378$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>KOUKITU, A</creatorcontrib><creatorcontrib>SEKI, H</creatorcontrib><title>Thermodynamic analysis on Molecular Beam Epitaxy of GaN, InN and AlN</title><title>Japanese Journal of Applied Physics</title><description>A chemical equilibrium model is applied to the Molecular Beam Epitaxy (MBE) growth of GaN, InN and AlN semiconductors using atomic nitrogen and NH
3
sources. The equilibrium partial pressure and the growth rate are calculated for each of the following parameters: input V/III ratio, input partial pressure of group III elements and growth temperature. A phase diagram for the deposition, indicating etching, droplet and growth regions, is computed for the growth of III–V nitrides. Based on the diagram, the growth condition suitable for the MBE growth of III–V nitrides is predicted.</description><subject>Cross-disciplinary physics: materials science; rheology</subject><subject>Exact sciences and technology</subject><subject>Materials science</subject><subject>Methods of deposition of films and coatings; film growth and epitaxy</subject><subject>Molecular, atomic, ion, and chemical beam epitaxy</subject><subject>Physics</subject><issn>0021-4922</issn><issn>1347-4065</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1997</creationdate><recordtype>article</recordtype><recordid>eNo9kD1PwzAURS0EEqWw8QM8MDbFz35xkrGUUlqFwlDm6OHYIlW-ZBep-fe0KmK6utK5dziM3YOYAqB63O2onyo9zZNYXLARKEwiFDq-ZCMhJESYSXnNbkLYHauOEUbsefttfdOVQ0tNZTi1VA-hCrxr-VtXW_NTk-dPlhq-6Ks9HQbeOb6kzYSv2s0RL_ms3tyyK0d1sHd_OWafL4vt_DXK35er-SyPDILYR1KbVKOyGWYWSWbgLKTWxV8qLksDpU4yBEepFIqcSdGi0TpBg64kQ2TUmE3Ov8Z3IXjrit5XDfmhAFGcDBTr9eyjULo4GTjiD2e8p2Codp5aU4X_jUwgU0mqfgEMN1rk</recordid><startdate>199706</startdate><enddate>199706</enddate><creator>KOUKITU, A</creator><creator>SEKI, H</creator><general>Japanese journal of applied physics</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>199706</creationdate><title>Thermodynamic analysis on Molecular Beam Epitaxy of GaN, InN and AlN</title><author>KOUKITU, A ; SEKI, H</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c410t-26c8643e949e4a291fe18ef5b35ddc1d67941fa8203afc84e4c6674c4fdacaac3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1997</creationdate><topic>Cross-disciplinary physics: materials science; rheology</topic><topic>Exact sciences and technology</topic><topic>Materials science</topic><topic>Methods of deposition of films and coatings; film growth and epitaxy</topic><topic>Molecular, atomic, ion, and chemical beam epitaxy</topic><topic>Physics</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>KOUKITU, A</creatorcontrib><creatorcontrib>SEKI, H</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><jtitle>Japanese Journal of Applied Physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>KOUKITU, A</au><au>SEKI, H</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Thermodynamic analysis on Molecular Beam Epitaxy of GaN, InN and AlN</atitle><jtitle>Japanese Journal of Applied Physics</jtitle><date>1997-06</date><risdate>1997</risdate><volume>36</volume><issue>6B</issue><spage>L750</spage><epage>L753</epage><pages>L750-L753</pages><issn>0021-4922</issn><eissn>1347-4065</eissn><coden>JJAPA5</coden><abstract>A chemical equilibrium model is applied to the Molecular Beam Epitaxy (MBE) growth of GaN, InN and AlN semiconductors using atomic nitrogen and NH
3
sources. The equilibrium partial pressure and the growth rate are calculated for each of the following parameters: input V/III ratio, input partial pressure of group III elements and growth temperature. A phase diagram for the deposition, indicating etching, droplet and growth regions, is computed for the growth of III–V nitrides. Based on the diagram, the growth condition suitable for the MBE growth of III–V nitrides is predicted.</abstract><cop>Tokyo</cop><pub>Japanese journal of applied physics</pub><doi>10.1143/jjap.36.L750</doi></addata></record> |
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subjects | Cross-disciplinary physics: materials science rheology Exact sciences and technology Materials science Methods of deposition of films and coatings film growth and epitaxy Molecular, atomic, ion, and chemical beam epitaxy Physics |
title | Thermodynamic analysis on Molecular Beam Epitaxy of GaN, InN and AlN |
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