Observation of nano-particle formation process in a laser-ablated plume using imaging spectroscopy

The behavior of atomic species and of growing nano-particles in the laser-ablated plume was observed by laser-induced fluorescence (LIF) and Rayleigh scattering (RS) imaging techniques, and the results on the ablation of silicon (Si) in a He ambient are presented. The particles were formed in a limi...

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Veröffentlicht in:Japanese Journal of Applied Physics 1997-05, Vol.36 (5A), p.L563-L565
Hauptverfasser: MURAMOTO, J, NAKATA, Y, OKADA, T, MAEDA, M
Format: Artikel
Sprache:eng
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Zusammenfassung:The behavior of atomic species and of growing nano-particles in the laser-ablated plume was observed by laser-induced fluorescence (LIF) and Rayleigh scattering (RS) imaging techniques, and the results on the ablation of silicon (Si) in a He ambient are presented. The particles were formed in a limited region in the plume with a characteristic spatial distribution. The growth of the particles was completed about 20 ms after ablation at a helium (He) ambient pressure of 1.33 kPa and 50 ms at 0.67 kPa. The spatial distributions of the particles was retained for more than one second.
ISSN:0021-4922
1347-4065
DOI:10.1143/jjap.36.l563