New method for the spectral radiance factor measurement of diffuse reflective substrates

We propose and demonstrate a new practical method for measuring the total/diffuse hemispherical reflectances and simultaneously reflected radiance factor of diffuse reflective substrates. This method involves the use of a collimated and focused monochromatic light beam and a specified integrating-sp...

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Veröffentlicht in:Japanese Journal of Applied Physics 1997-03, Vol.36 (3A), p.L310-L312
Hauptverfasser: SHIMOKAWA, R, SAITO, I, IGARI, S
Format: Artikel
Sprache:eng
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Zusammenfassung:We propose and demonstrate a new practical method for measuring the total/diffuse hemispherical reflectances and simultaneously reflected radiance factor of diffuse reflective substrates. This method involves the use of a collimated and focused monochromatic light beam and a specified integrating-sphere detector. The reflected radiance factor can be computed from the differential of the reflectance as a function of the polar angle.
ISSN:0021-4922
1347-4065
DOI:10.1143/jjap.36.L310