New method for the spectral radiance factor measurement of diffuse reflective substrates
We propose and demonstrate a new practical method for measuring the total/diffuse hemispherical reflectances and simultaneously reflected radiance factor of diffuse reflective substrates. This method involves the use of a collimated and focused monochromatic light beam and a specified integrating-sp...
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Veröffentlicht in: | Japanese Journal of Applied Physics 1997-03, Vol.36 (3A), p.L310-L312 |
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Hauptverfasser: | , , |
Format: | Artikel |
Sprache: | eng |
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Online-Zugang: | Volltext |
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Zusammenfassung: | We propose and demonstrate a new practical method for measuring the total/diffuse hemispherical reflectances and simultaneously reflected radiance factor of diffuse reflective substrates. This method involves the use of a collimated and focused monochromatic light beam and a specified integrating-sphere detector. The reflected radiance factor can be computed from the differential of the reflectance as a function of the polar angle. |
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ISSN: | 0021-4922 1347-4065 |
DOI: | 10.1143/jjap.36.L310 |