Structures on Si(100) 2 × 1 at the Initial Stages of Homoepitaxy by SiH 4 Decomposition
The initial stages of homoepitaxial island formation on Si(100)2×1 by SiH 4 decomposition under ultra high vacuum chemical vapor deposition conditions are studied by scanning tunneling microscopy and kinetic model calculations. The concentrations of the intermediate species formed on the surface dur...
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Veröffentlicht in: | Japanese Journal of Applied Physics 1997-06, Vol.36 (6S), p.3804 |
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container_issue | 6S |
container_start_page | 3804 |
container_title | Japanese Journal of Applied Physics |
container_volume | 36 |
creator | Fehrenbacher, Matthias Spitzmüller, Jürgen Pitter, Michael Hubert Rauscher, Hubert Rauscher R. Jürgen Behm, R. Jürgen Behm |
description | The initial stages of homoepitaxial island formation on Si(100)2×1 by SiH
4
decomposition under ultra high vacuum chemical vapor deposition conditions are studied by scanning tunneling microscopy and kinetic model calculations. The concentrations of the intermediate species formed on the surface during SiH
4
decomposition are calculated from the kinetic parameters of the dissociation cascade leading to Si film growth in the temperature regime of 500 to 800 K and for SiH
4
pressures in the range of 2×10
-7
to 2×10
-5
mbar. Experimental results showing the surface topography after interaction with SiH
4
at various surface temperatures and deposition rates are presented, and the observed surface structures are related to the different surface conditions, i.e., deposition flux and sample temperature, under which islands are formed. |
doi_str_mv | 10.1143/JJAP.36.3804 |
format | Article |
fullrecord | <record><control><sourceid>crossref</sourceid><recordid>TN_cdi_crossref_primary_10_1143_JJAP_36_3804</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_1143_JJAP_36_3804</sourcerecordid><originalsourceid>FETCH-LOGICAL-c1466-6f163474ade66f14f21e29a3feb7197b8e7a32f16ffbfd679ac3298b59c255d73</originalsourceid><addsrcrecordid>eNotkN1KxDAQRoMoWFfvfIC5VLBrJknT9nJZf7rLgkIVvCtpm2hl25QmC_ZJfCBfzBa9mhk48_FxCLlEukQU_Ha7XT0vuVzyhIojEiAXcSiojI5JQCnDUKSMnZIz5z6nU0YCA_KW--FQ-cOgHdgO8uYKKb0GBj_fgKA8-A8Nm67xjdpD7tX7zBnIbGt133j1NUI5Tm8ZCLjTlW176ybYdufkxKi90xf_c0FeH-5f1lm4e3rcrFe7sEIhZSgNyqmmULWW0y4MQ81SxY0uY0zjMtGx4myCjClNLeNUVZylSRmlFYuiOuYLcvOXWw3WuUGboh-aVg1jgbSYrRSzlYLLYrbCfwHok1OJ</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Structures on Si(100) 2 × 1 at the Initial Stages of Homoepitaxy by SiH 4 Decomposition</title><source>IOP Publishing Journals</source><source>Institute of Physics (IOP) Journals - HEAL-Link</source><creator>Fehrenbacher, Matthias ; Spitzmüller, Jürgen ; Pitter, Michael ; Hubert Rauscher, Hubert Rauscher ; R. Jürgen Behm, R. Jürgen Behm</creator><creatorcontrib>Fehrenbacher, Matthias ; Spitzmüller, Jürgen ; Pitter, Michael ; Hubert Rauscher, Hubert Rauscher ; R. Jürgen Behm, R. Jürgen Behm</creatorcontrib><description>The initial stages of homoepitaxial island formation on Si(100)2×1 by SiH
4
decomposition under ultra high vacuum chemical vapor deposition conditions are studied by scanning tunneling microscopy and kinetic model calculations. The concentrations of the intermediate species formed on the surface during SiH
4
decomposition are calculated from the kinetic parameters of the dissociation cascade leading to Si film growth in the temperature regime of 500 to 800 K and for SiH
4
pressures in the range of 2×10
-7
to 2×10
-5
mbar. Experimental results showing the surface topography after interaction with SiH
4
at various surface temperatures and deposition rates are presented, and the observed surface structures are related to the different surface conditions, i.e., deposition flux and sample temperature, under which islands are formed.</description><identifier>ISSN: 0021-4922</identifier><identifier>EISSN: 1347-4065</identifier><identifier>DOI: 10.1143/JJAP.36.3804</identifier><language>eng</language><ispartof>Japanese Journal of Applied Physics, 1997-06, Vol.36 (6S), p.3804</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c1466-6f163474ade66f14f21e29a3feb7197b8e7a32f16ffbfd679ac3298b59c255d73</citedby><cites>FETCH-LOGICAL-c1466-6f163474ade66f14f21e29a3feb7197b8e7a32f16ffbfd679ac3298b59c255d73</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27901,27902</link.rule.ids></links><search><creatorcontrib>Fehrenbacher, Matthias</creatorcontrib><creatorcontrib>Spitzmüller, Jürgen</creatorcontrib><creatorcontrib>Pitter, Michael</creatorcontrib><creatorcontrib>Hubert Rauscher, Hubert Rauscher</creatorcontrib><creatorcontrib>R. Jürgen Behm, R. Jürgen Behm</creatorcontrib><title>Structures on Si(100) 2 × 1 at the Initial Stages of Homoepitaxy by SiH 4 Decomposition</title><title>Japanese Journal of Applied Physics</title><description>The initial stages of homoepitaxial island formation on Si(100)2×1 by SiH
4
decomposition under ultra high vacuum chemical vapor deposition conditions are studied by scanning tunneling microscopy and kinetic model calculations. The concentrations of the intermediate species formed on the surface during SiH
4
decomposition are calculated from the kinetic parameters of the dissociation cascade leading to Si film growth in the temperature regime of 500 to 800 K and for SiH
4
pressures in the range of 2×10
-7
to 2×10
-5
mbar. Experimental results showing the surface topography after interaction with SiH
4
at various surface temperatures and deposition rates are presented, and the observed surface structures are related to the different surface conditions, i.e., deposition flux and sample temperature, under which islands are formed.</description><issn>0021-4922</issn><issn>1347-4065</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1997</creationdate><recordtype>article</recordtype><recordid>eNotkN1KxDAQRoMoWFfvfIC5VLBrJknT9nJZf7rLgkIVvCtpm2hl25QmC_ZJfCBfzBa9mhk48_FxCLlEukQU_Ha7XT0vuVzyhIojEiAXcSiojI5JQCnDUKSMnZIz5z6nU0YCA_KW--FQ-cOgHdgO8uYKKb0GBj_fgKA8-A8Nm67xjdpD7tX7zBnIbGt133j1NUI5Tm8ZCLjTlW176ybYdufkxKi90xf_c0FeH-5f1lm4e3rcrFe7sEIhZSgNyqmmULWW0y4MQ81SxY0uY0zjMtGx4myCjClNLeNUVZylSRmlFYuiOuYLcvOXWw3WuUGboh-aVg1jgbSYrRSzlYLLYrbCfwHok1OJ</recordid><startdate>19970601</startdate><enddate>19970601</enddate><creator>Fehrenbacher, Matthias</creator><creator>Spitzmüller, Jürgen</creator><creator>Pitter, Michael</creator><creator>Hubert Rauscher, Hubert Rauscher</creator><creator>R. Jürgen Behm, R. Jürgen Behm</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>19970601</creationdate><title>Structures on Si(100) 2 × 1 at the Initial Stages of Homoepitaxy by SiH 4 Decomposition</title><author>Fehrenbacher, Matthias ; Spitzmüller, Jürgen ; Pitter, Michael ; Hubert Rauscher, Hubert Rauscher ; R. Jürgen Behm, R. Jürgen Behm</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c1466-6f163474ade66f14f21e29a3feb7197b8e7a32f16ffbfd679ac3298b59c255d73</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1997</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Fehrenbacher, Matthias</creatorcontrib><creatorcontrib>Spitzmüller, Jürgen</creatorcontrib><creatorcontrib>Pitter, Michael</creatorcontrib><creatorcontrib>Hubert Rauscher, Hubert Rauscher</creatorcontrib><creatorcontrib>R. Jürgen Behm, R. Jürgen Behm</creatorcontrib><collection>CrossRef</collection><jtitle>Japanese Journal of Applied Physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Fehrenbacher, Matthias</au><au>Spitzmüller, Jürgen</au><au>Pitter, Michael</au><au>Hubert Rauscher, Hubert Rauscher</au><au>R. Jürgen Behm, R. Jürgen Behm</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Structures on Si(100) 2 × 1 at the Initial Stages of Homoepitaxy by SiH 4 Decomposition</atitle><jtitle>Japanese Journal of Applied Physics</jtitle><date>1997-06-01</date><risdate>1997</risdate><volume>36</volume><issue>6S</issue><spage>3804</spage><pages>3804-</pages><issn>0021-4922</issn><eissn>1347-4065</eissn><abstract>The initial stages of homoepitaxial island formation on Si(100)2×1 by SiH
4
decomposition under ultra high vacuum chemical vapor deposition conditions are studied by scanning tunneling microscopy and kinetic model calculations. The concentrations of the intermediate species formed on the surface during SiH
4
decomposition are calculated from the kinetic parameters of the dissociation cascade leading to Si film growth in the temperature regime of 500 to 800 K and for SiH
4
pressures in the range of 2×10
-7
to 2×10
-5
mbar. Experimental results showing the surface topography after interaction with SiH
4
at various surface temperatures and deposition rates are presented, and the observed surface structures are related to the different surface conditions, i.e., deposition flux and sample temperature, under which islands are formed.</abstract><doi>10.1143/JJAP.36.3804</doi></addata></record> |
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source | IOP Publishing Journals; Institute of Physics (IOP) Journals - HEAL-Link |
title | Structures on Si(100) 2 × 1 at the Initial Stages of Homoepitaxy by SiH 4 Decomposition |
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