Observation of atomic defects on LiF(100) surface with ultrahigh vacuum atomic force microscope (UHV AFM)

We have constructed an atomic force microscope (AFM) operating under an ultrahigh vacuum (UHV). We have imaged the cleaved (100) surface of LiF ionic crystal to clarify the AFM's performance. As a result, for the first time, we have obtained atomically resolved AFM images of atomic defects pene...

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Veröffentlicht in:	Japanese Journal of Applied Physics 1993-06, Vol.32 (6B), p.2980-2982
Hauptverfasser:	OHTA, M, KONISHI, T, SUGAWARA, Y, MORITA, S, SUZUKI, M, ENOMOTO, Y
Format:	Artikel
Sprache:	eng
Schlagworte:	Composition defects and impurities Condensed matter: structure, mechanical and thermal properties Defects and impurities in crystals microstructure Direct observation of dislocations and other defects (etch pits, decoration, electron microscopy, x-ray topography, etc.) Electron, ion, and scanning probe microscopy Exact sciences and technology Physics Scanning probe microscopy: scanning tunneling, atomic force, scanning optical, magnetic force, etc Solid surfaces and solid-solid interfaces Structure of solids and liquids crystallography Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties)
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Beschreibung
Zusammenfassung:	We have constructed an atomic force microscope (AFM) operating under an ultrahigh vacuum (UHV). We have imaged the cleaved (100) surface of LiF ionic crystal to clarify the AFM's performance. As a result, for the first time, we have obtained atomically resolved AFM images of atomic defects penetrating the surface. This result seems to suggest that the cleaved LiF (100) surface was imaged under the condition of monoatomic or small cluster tip-sample interaction.
ISSN:	0021-4922 1347-4065
DOI:	10.1143/JJAP.32.2980