A new interpretation of the orientation effect in GaAs metal semiconductor field effect transistors
This paper presents a new explanation of the orientation effect of self-aligned WSix gate GaAs MESFET's by taking the different channel-substrate interfaces formed in the [011] and [011̄] directions due to the piezoelectric charges in GaAs MESFET's into account. The predicted results are i...
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Veröffentlicht in: | Japanese Journal of Applied Physics 1991, Vol.30 (1A), p.L11-L14 |
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Sprache: | eng |
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