Effect of residual strain on the splitting of excitonic luminescence lines in epitaxially grown ZnSe/GaAs
Polarization characteristics for excitonic luminescence lines of epitaxially grown ZnSe on GaAs demonstrate the splitting of the neutral donor-bound exciton as well as the free exciton due to the residual strain in the epilayer. The strain is interpreted well by the misfit of the calculated lattice...
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Veröffentlicht in: | Japanese Journal of Applied Physics 1990-08, Vol.29 (8), p.1504-1505 |
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Sprache: | eng |
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