Microwave Behaviour of Bi 2 O 3 , TiO 2 and γ-Fe 2 O 3 Thick Film Overlays on Microstrip Rejection Filter

The paper reports the preliminary studies on the effect of thick film overlays of Bi 2 O 3 , TiO 2 and γ-Fe 2 O 3 materials on microstrip rejection filters. Variation of resonant frequency and quality factor of the rejection filter with overlay thickness are studied. It is observed that resonant rej...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Japanese Journal of Applied Physics 1988-11, Vol.27 (11R), p.2168
Hauptverfasser: Joshi, A. M., Mandhre, M. M., Jadhav, M. L., Gangal, S. A., Karekar, R. N.
Format: Artikel
Sprache:eng
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:The paper reports the preliminary studies on the effect of thick film overlays of Bi 2 O 3 , TiO 2 and γ-Fe 2 O 3 materials on microstrip rejection filters. Variation of resonant frequency and quality factor of the rejection filter with overlay thickness are studied. It is observed that resonant rejection frequency and quality factor decrease smoothly with increase in the overlay thickness for Bi 2 O 3 & TiO 2 with logarithmic relation; but for γ-Fe 2 O 3 after a particular thickness, resonant rejection abruptly disappears and its variation is slightly orientation dependent.
ISSN:0021-4922
1347-4065
DOI:10.1143/JJAP.27.2168