A hole trap center related to the 2.361 eV bound exciton emission in ZnTe single crystals
The heat-treatment effects of ZnTe single crystals which contain a low concentration of Te inclusions were investigated by photoluminescence, optical-absorption and admittance spectra measurements. A correlation between the 2.361 eV bound exciton emission and hole traps located at 0.39 eV above the...
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Veröffentlicht in: | Japanese Journal of Applied Physics 1986-06, Vol.25 (6), p.910-911 |
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Hauptverfasser: | , , , , |
Format: | Artikel |
Sprache: | eng |
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Online-Zugang: | Volltext |
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Zusammenfassung: | The heat-treatment effects of ZnTe single crystals which contain a low concentration of Te inclusions were investigated by photoluminescence, optical-absorption and admittance spectra measurements. A correlation between the 2.361 eV bound exciton emission and hole traps located at 0.39 eV above the valence band is reported. |
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ISSN: | 0021-4922 1347-4065 |
DOI: | 10.1143/jjap.25.910 |