Simultaneous charged particle activation analysis of carbon and boron in gallium arsenide
A simple method has been developed for simultaneous determination of carbon and boron in GaAs by deuteron activation analysis. The detection limit is 2×10 14 atoms·cm -3 for both elements. The determined carbon concentrations are compared with the results of IR spectrophotometry.
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| Veröffentlicht in: | Japanese Journal of Applied Physics 1985-01, Vol.24 (10), p.L801-L802 |
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| Format: | Artikel |
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| container_end_page | L802 |
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| container_issue | 10 |
| container_start_page | L801 |
| container_title | Japanese Journal of Applied Physics |
| container_volume | 24 |
| creator | NOZAKI, T ITOH, Y OHKUBO, Y KIMURA, T FUKUSHIMA, H |
| description | A simple method has been developed for simultaneous determination of carbon and boron in GaAs by deuteron activation analysis. The detection limit is 2×10
14
atoms·cm
-3
for both elements. The determined carbon concentrations are compared with the results of IR spectrophotometry. |
| doi_str_mv | 10.1143/jjap.24.l801 |
| format | Article |
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14
atoms·cm
-3
for both elements. The determined carbon concentrations are compared with the results of IR spectrophotometry.</description><identifier>ISSN: 0021-4922</identifier><identifier>EISSN: 1347-4065</identifier><identifier>DOI: 10.1143/jjap.24.l801</identifier><identifier>CODEN: JJAPA5</identifier><language>eng</language><publisher>Tokyo: Japanese journal of applied physics</publisher><subject>Condensed matter: structure, mechanical and thermal properties ; Defects and impurities in crystals; microstructure ; Exact sciences and technology ; Impurities: concentration, distribution, and gradients ; Physics ; Structure of solids and liquids; crystallography</subject><ispartof>Japanese Journal of Applied Physics, 1985-01, Vol.24 (10), p.L801-L802</ispartof><rights>1986 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c357t-683c59a1fe4f2a8a285c9232b71f39e6bd0ef44433fcc19279ffbf63abd0c2343</citedby><cites>FETCH-LOGICAL-c357t-683c59a1fe4f2a8a285c9232b71f39e6bd0ef44433fcc19279ffbf63abd0c2343</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27901,27902</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=8745705$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>NOZAKI, T</creatorcontrib><creatorcontrib>ITOH, Y</creatorcontrib><creatorcontrib>OHKUBO, Y</creatorcontrib><creatorcontrib>KIMURA, T</creatorcontrib><creatorcontrib>FUKUSHIMA, H</creatorcontrib><title>Simultaneous charged particle activation analysis of carbon and boron in gallium arsenide</title><title>Japanese Journal of Applied Physics</title><description>A simple method has been developed for simultaneous determination of carbon and boron in GaAs by deuteron activation analysis. The detection limit is 2×10
14
atoms·cm
-3
for both elements. The determined carbon concentrations are compared with the results of IR spectrophotometry.</description><subject>Condensed matter: structure, mechanical and thermal properties</subject><subject>Defects and impurities in crystals; microstructure</subject><subject>Exact sciences and technology</subject><subject>Impurities: concentration, distribution, and gradients</subject><subject>Physics</subject><subject>Structure of solids and liquids; crystallography</subject><issn>0021-4922</issn><issn>1347-4065</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1985</creationdate><recordtype>article</recordtype><recordid>eNo9kEtPwzAQhC0EEqVw4wf4wJEUP9Z5HKsKClUlkIADp2jj2MWR85CdIvXfEyjitLuzM3P4CLnmbME5yLumwWEhYOFzxk_IjEvIEmCpOiUzxgRPoBDinFzE2ExnqoDPyMera_d-xM70-0j1J4adqemAYXTaG4p6dF84ur6j2KE_RBdpb6nGUP1KNa36MG2uozv03u1biiGaztXmkpxZ9NFc_c05eX-4f1s9Jtvn9dNquU20VNmYpLnUqkBuDViBOYpc6UJIUWXcysKkVc2MBQAprda8EFlhbWVTidNDCwlyTm6PvTr0MQZjyyG4FsOh5Kz8wVJuNsuXUkC5nbBM9pujfcCo0duAnXbxP5NnoDKm5Df9l2R9</recordid><startdate>19850101</startdate><enddate>19850101</enddate><creator>NOZAKI, T</creator><creator>ITOH, Y</creator><creator>OHKUBO, Y</creator><creator>KIMURA, T</creator><creator>FUKUSHIMA, H</creator><general>Japanese journal of applied physics</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>19850101</creationdate><title>Simultaneous charged particle activation analysis of carbon and boron in gallium arsenide</title><author>NOZAKI, T ; ITOH, Y ; OHKUBO, Y ; KIMURA, T ; FUKUSHIMA, H</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c357t-683c59a1fe4f2a8a285c9232b71f39e6bd0ef44433fcc19279ffbf63abd0c2343</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1985</creationdate><topic>Condensed matter: structure, mechanical and thermal properties</topic><topic>Defects and impurities in crystals; microstructure</topic><topic>Exact sciences and technology</topic><topic>Impurities: concentration, distribution, and gradients</topic><topic>Physics</topic><topic>Structure of solids and liquids; crystallography</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>NOZAKI, T</creatorcontrib><creatorcontrib>ITOH, Y</creatorcontrib><creatorcontrib>OHKUBO, Y</creatorcontrib><creatorcontrib>KIMURA, T</creatorcontrib><creatorcontrib>FUKUSHIMA, H</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><jtitle>Japanese Journal of Applied Physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>NOZAKI, T</au><au>ITOH, Y</au><au>OHKUBO, Y</au><au>KIMURA, T</au><au>FUKUSHIMA, H</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Simultaneous charged particle activation analysis of carbon and boron in gallium arsenide</atitle><jtitle>Japanese Journal of Applied Physics</jtitle><date>1985-01-01</date><risdate>1985</risdate><volume>24</volume><issue>10</issue><spage>L801</spage><epage>L802</epage><pages>L801-L802</pages><issn>0021-4922</issn><eissn>1347-4065</eissn><coden>JJAPA5</coden><abstract>A simple method has been developed for simultaneous determination of carbon and boron in GaAs by deuteron activation analysis. The detection limit is 2×10
14
atoms·cm
-3
for both elements. The determined carbon concentrations are compared with the results of IR spectrophotometry.</abstract><cop>Tokyo</cop><pub>Japanese journal of applied physics</pub><doi>10.1143/jjap.24.l801</doi></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0021-4922 |
| ispartof | Japanese Journal of Applied Physics, 1985-01, Vol.24 (10), p.L801-L802 |
| issn | 0021-4922 1347-4065 |
| language | eng |
| recordid | cdi_crossref_primary_10_1143_JJAP_24_L801 |
| source | IOP Publishing Journals; Institute of Physics (IOP) Journals - HEAL-Link |
| subjects | Condensed matter: structure, mechanical and thermal properties Defects and impurities in crystals microstructure Exact sciences and technology Impurities: concentration, distribution, and gradients Physics Structure of solids and liquids crystallography |
| title | Simultaneous charged particle activation analysis of carbon and boron in gallium arsenide |
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