Growth of single domain GaAs layer on (100)-oriented Si substrate by MOCVD

Single domain GaAs layers with satisfactory morphology were grown on (100)-oriented Si substrates by heat treatment of the substrates at above 900°C and subsecquent two-step growth at low temperatures of 450°C or below and by conventional growth temperatures. The grown GaAs layers showed a high mobi...

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Veröffentlicht in:Japanese Journal of Applied Physics 1984-01, Vol.23 (11), p.L843-L845
Hauptverfasser: AKIYAMA, M, KAWARADA, Y, KAMINISHI, K
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container_title Japanese Journal of Applied Physics
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creator AKIYAMA, M
KAWARADA, Y
KAMINISHI, K
description Single domain GaAs layers with satisfactory morphology were grown on (100)-oriented Si substrates by heat treatment of the substrates at above 900°C and subsecquent two-step growth at low temperatures of 450°C or below and by conventional growth temperatures. The grown GaAs layers showed a high mobility of 5200 cm 2 V -1 s -1 at room temperature with a carrier density of 1×10 16 cm -3 .
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subjects Condensed matter: structure, mechanical and thermal properties
Exact sciences and technology
Physics
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
Thin film structure and morphology
title Growth of single domain GaAs layer on (100)-oriented Si substrate by MOCVD
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