Growth of single domain GaAs layer on (100)-oriented Si substrate by MOCVD
Single domain GaAs layers with satisfactory morphology were grown on (100)-oriented Si substrates by heat treatment of the substrates at above 900°C and subsecquent two-step growth at low temperatures of 450°C or below and by conventional growth temperatures. The grown GaAs layers showed a high mobi...
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Veröffentlicht in: | Japanese Journal of Applied Physics 1984-01, Vol.23 (11), p.L843-L845 |
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container_issue | 11 |
container_start_page | L843 |
container_title | Japanese Journal of Applied Physics |
container_volume | 23 |
creator | AKIYAMA, M KAWARADA, Y KAMINISHI, K |
description | Single domain GaAs layers with satisfactory morphology were grown on (100)-oriented Si substrates by heat treatment of the substrates at above 900°C and subsecquent two-step growth at low temperatures of 450°C or below and by conventional growth temperatures. The grown GaAs layers showed a high mobility of 5200 cm
2
V
-1
s
-1
at room temperature with a carrier density of 1×10
16
cm
-3
. |
doi_str_mv | 10.1143/jjap.23.l843 |
format | Article |
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2
V
-1
s
-1
at room temperature with a carrier density of 1×10
16
cm
-3
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2
V
-1
s
-1
at room temperature with a carrier density of 1×10
16
cm
-3
.</description><subject>Condensed matter: structure, mechanical and thermal properties</subject><subject>Exact sciences and technology</subject><subject>Physics</subject><subject>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</subject><subject>Thin film structure and morphology</subject><issn>0021-4922</issn><issn>1347-4065</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1984</creationdate><recordtype>article</recordtype><recordid>eNo9kE1Lw0AURQdRsFZ3_oBZuFAwdd7Mm0myLFWrpVLBj214M5loSpqUmYj03xupuLpcOPcuDmPnICYAqG7Wa9pOpJo0GaoDNgKFaYLC6EM2EkJCgrmUx-wkxvVQjUYYscU8dN_9J-8qHuv2o_G87DZUt3xO08gb2vnAu5ZfghBXSRdq3_a-5C81j1829oF6z-2OP61m77en7KiiJvqzvxyzt_u719lDslzNH2fTZeKUTvskFTmkNie0KAGNIVPKHGQG4AR5KI3SGSiy1lvQNs-U1pl2DrGszIA6NWbX-18XuhiDr4ptqDcUdgWI4tdDsVhMnwupiuXgYcAv9viWoqOmCtS6Ov5vcmkQhVA_P4Va9w</recordid><startdate>19840101</startdate><enddate>19840101</enddate><creator>AKIYAMA, M</creator><creator>KAWARADA, Y</creator><creator>KAMINISHI, K</creator><general>Japanese journal of applied physics</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>19840101</creationdate><title>Growth of single domain GaAs layer on (100)-oriented Si substrate by MOCVD</title><author>AKIYAMA, M ; KAWARADA, Y ; KAMINISHI, K</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c357t-70917b9a4b421466a6d2912811c0ae1d635813abbeb15b9835585cc44df66d2c3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1984</creationdate><topic>Condensed matter: structure, mechanical and thermal properties</topic><topic>Exact sciences and technology</topic><topic>Physics</topic><topic>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</topic><topic>Thin film structure and morphology</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>AKIYAMA, M</creatorcontrib><creatorcontrib>KAWARADA, Y</creatorcontrib><creatorcontrib>KAMINISHI, K</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><jtitle>Japanese Journal of Applied Physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>AKIYAMA, M</au><au>KAWARADA, Y</au><au>KAMINISHI, K</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Growth of single domain GaAs layer on (100)-oriented Si substrate by MOCVD</atitle><jtitle>Japanese Journal of Applied Physics</jtitle><date>1984-01-01</date><risdate>1984</risdate><volume>23</volume><issue>11</issue><spage>L843</spage><epage>L845</epage><pages>L843-L845</pages><issn>0021-4922</issn><eissn>1347-4065</eissn><coden>JJAPA5</coden><abstract>Single domain GaAs layers with satisfactory morphology were grown on (100)-oriented Si substrates by heat treatment of the substrates at above 900°C and subsecquent two-step growth at low temperatures of 450°C or below and by conventional growth temperatures. The grown GaAs layers showed a high mobility of 5200 cm
2
V
-1
s
-1
at room temperature with a carrier density of 1×10
16
cm
-3
.</abstract><cop>Tokyo</cop><pub>Japanese journal of applied physics</pub><doi>10.1143/jjap.23.l843</doi></addata></record> |
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source | Institute of Physics Journals |
subjects | Condensed matter: structure, mechanical and thermal properties Exact sciences and technology Physics Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) Thin film structure and morphology |
title | Growth of single domain GaAs layer on (100)-oriented Si substrate by MOCVD |
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