Ohmic Contact Properties of Magnesium Evaporated onto Undoped and P-doped a-Si: H
We have investigated the current-voltage characteristics of metal/undoped a -Si: H/ n + (or p + ) c -Si structures using Mg, Au, Pt and Al. It has been indicated that the energy band of undoped a-Si: H shows a downward bending against Mg, being analogous to n + a -Si: H/undoped a -Si: H contact, whi...
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Veröffentlicht in: | Japanese Journal of Applied Physics 1983-01, Vol.22 (3A), p.L197 |
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Hauptverfasser: | , , , , , , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
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Zusammenfassung: | We have investigated the current-voltage characteristics of metal/undoped
a
-Si: H/
n
+
(or
p
+
)
c
-Si structures using Mg, Au, Pt and Al. It has been indicated that the energy band of undoped a-Si: H shows a downward bending against Mg, being analogous to
n
+
a
-Si: H/undoped
a
-Si: H contact, while the band shows an upward bending against Au, Pt and Al. Mg/undoped
a
-Si: H contact is found to allow injection of electrons into the conduction band of
a
-Si: H, providing us a good ohmic contact property. This contact does not exhibit the thermal-degradation at least up to 100°C. |
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ISSN: | 0021-4922 1347-4065 |
DOI: | 10.1143/JJAP.22.L197 |