AsH 3 to Ga(CH 3 ) 3 Mole Ratio Dependence of Dominant Deep Levels in MOCVD GaAs

Dependence of the 0.8 eV electron trap (so-called EL2) concentration on the As/Ga mole ratio during growth in MOCVD GaAs has been investigated by varying growth temperatures. It has been found that a demarcation exists in the growth temperatures, which divides two regions with different trap concent...

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Veröffentlicht in:Japanese Journal of Applied Physics 1983-06, Vol.22 (6R), p.923
Hauptverfasser: Watanabe, Miyoko Oku, Tanaka, Atsushi, Udagawa, Takashi, Nakanishi, Takatosi, Zohta, Yasuhito
Format: Artikel
Sprache:eng
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Zusammenfassung:Dependence of the 0.8 eV electron trap (so-called EL2) concentration on the As/Ga mole ratio during growth in MOCVD GaAs has been investigated by varying growth temperatures. It has been found that a demarcation exists in the growth temperatures, which divides two regions with different trap concentration-As/Ga mole ratio relationships. The trap concentration increases with the As/Ga mole ratio by the one-fourth power at growth temperatures of 630°C and 660°C, while it increases with the As/Ga mole ratio by the one-half power at 720°C and 740°C. Corresponding with this difference, there is a slight difference in activation energies between the materials grown at the lower temperatures and those grown at the higher temperatures. A possible explanation based on thermodynamic considerations is presented.
ISSN:0021-4922
1347-4065
DOI:10.1143/JJAP.22.923