AsH 3 to Ga(CH 3 ) 3 Mole Ratio Dependence of Dominant Deep Levels in MOCVD GaAs
Dependence of the 0.8 eV electron trap (so-called EL2) concentration on the As/Ga mole ratio during growth in MOCVD GaAs has been investigated by varying growth temperatures. It has been found that a demarcation exists in the growth temperatures, which divides two regions with different trap concent...
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Veröffentlicht in: | Japanese Journal of Applied Physics 1983-06, Vol.22 (6R), p.923 |
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Hauptverfasser: | , , , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | Dependence of the 0.8 eV electron trap (so-called EL2) concentration on the As/Ga mole ratio during growth in MOCVD GaAs has been investigated by varying growth temperatures. It has been found that a demarcation exists in the growth temperatures, which divides two regions with different trap concentration-As/Ga mole ratio relationships. The trap concentration increases with the As/Ga mole ratio by the one-fourth power at growth temperatures of 630°C and 660°C, while it increases with the As/Ga mole ratio by the one-half power at 720°C and 740°C. Corresponding with this difference, there is a slight difference in activation energies between the materials grown at the lower temperatures and those grown at the higher temperatures. A possible explanation based on thermodynamic considerations is presented. |
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ISSN: | 0021-4922 1347-4065 |
DOI: | 10.1143/JJAP.22.923 |