Inelastic Low Energy Electron Diffraction Measurements of Hydrogen Adsorbed Si (001) Surfaces: 2×1:H and 1×1: :2H
We identified the monohydride phase Si(001)2×1:H and the dihydride phase Si(001)1×1: :2H by angle resolved electron energy loss profiles and I – V curves of 00-beam. For the 2×1:H-saturated surfaces, S 3 transition from back bond surface state was observed although S 1 transition from dangling bond...
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Veröffentlicht in: | Japanese Journal of Applied Physics 1982-05, Vol.21 (5A), p.L263 |
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Hauptverfasser: | , , , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | We identified the monohydride phase Si(001)2×1:H and the dihydride phase Si(001)1×1: :2H by angle resolved electron energy loss profiles and
I
–
V
curves of 00-beam. For the 2×1:H-saturated surfaces, S
3
transition from back bond surface state was observed although S
1
transition from dangling bond surface state disappeared. For the 1×1: :2H surface, S
2
and S
3
transitions from back bond surface states completely disappeared but S
1
transition was observed. We clearly distinguished hydrogen induced loss peaks for the two surfaces: the peaks were at 8 eV for the 2×1:H surface and at 7 eV for the 1×1: :2H surface. |
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ISSN: | 0021-4922 1347-4065 |
DOI: | 10.1143/JJAP.21.L263 |