X-Ray Photoelectron Spectroscopy of Ag- and Cu-Doped Amorphous As 2 Se 3

X-ray phototelectron spectroscopy was used to determine the binding energies of the core electrons in Ag- or Cu-doped amorphous As 2 Se 3 films. Chemical shifts of the constituent elements indicate the electron transfer from Ag or Cu to As and Se upon doping. Charged defects are induced to As-Se bonds. The mechanism of the migration of Ag and Cu in amorphous As 2 Se 3 is discussed.