High-Throughput Measurement Method for Time--Temperature-Transformation Diagram of Thin Film Amorphous Alloys

The time--temperature-transformation (TTT) diagram of amorphous alloys is important for the applications of alloys. However, measurement for it by the conventional method is a time-consuming process. We propose a high-throughput measurement method for compiling TTT diagrams of thin film amorphous alloys. For this method, a temperature gradient furnace system is used. The thin film sample is isothermally heated with a temperature gradient and monitored by thermography. Thermography can detect crystallization. Therefore, the times required for crystallization at various temperatures can be measured at once. The validity of this method is shown by comparison with the results of the conventional method.