Femtosecond X-ray free-electron lasers: A new tool for studying nanocrystals and single macromolecules

A brief overview of the design of femtosecond X-ray free-electron lasers (XFEL), characteristics of the emitted X-ray pulses, and potentialities of XFEL are presented. A concise analysis of the problems in modeling X-ray scattering patterns produced by ultraintense radiation sources is given.

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Bibliographische Detailangaben
Veröffentlicht in:	Russian journal of physical chemistry. B 2014-07, Vol.8 (4), p.445-456
Hauptverfasser:	Krupyanskii, Yu. F., Balabaev, N. K., Petrova, T. E., Sinitsyn, D. O., Gryzlova, E. V., Tereshkina, K. B., Abdulnasyrov, E. G., Stepanov, A. S., Lunin, V. Yu, Grum-Grzhimailo, A. N.
Format:	Artikel
Sprache:	eng
Schlagworte:	Chemistry Chemistry and Materials Science Physical Chemistry Structure of Chemical Compounds. Spectroscopy
Online-Zugang:	Volltext
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Beschreibung
Zusammenfassung:	A brief overview of the design of femtosecond X-ray free-electron lasers (XFEL), characteristics of the emitted X-ray pulses, and potentialities of XFEL are presented. A concise analysis of the problems in modeling X-ray scattering patterns produced by ultraintense radiation sources is given.
ISSN:	1990-7931 1990-7923
DOI:	10.1134/S1990793114040046