Structural peculiarities of amorphous semiconductors As33.3Se33.3S33.4 and As33.3Se33.3Te33.4 doped with samarium
The structure of chalcogenide vitreous semiconductors (CVSs) As 33.3 Se 33.3 S 33.4 and As 33.3 Se 33.3 Te 33.4 and the influence on them of samarium additives is studied using the technique of X-ray diffraction. The observed peculiarities of the diffraction picture are explained by the Elliott void...
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| Veröffentlicht in: | Glass physics and chemistry 2014-09, Vol.40 (5), p.549-552 |
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| creator | Alekberov, R. I. Isayeva, G. A. Mekhtiyeva, S. I. Isayev, A. I. |
| description | The structure of chalcogenide vitreous semiconductors (CVSs) As
33.3
Se
33.3
S
33.4
and As
33.3
Se
33.3
Te
33.4
and the influence on them of samarium additives is studied using the technique of X-ray diffraction. The observed peculiarities of the diffraction picture are explained by the Elliott void-cluster model. The structural parameters of CVS materials As
33.3
Se
33.3
S
33.4
and As
33.3
Se
33.3
Te
33.4
with and without admixtures of samarium are determined. |
| doi_str_mv | 10.1134/S1087659614050022 |
| format | Article |
| fullrecord | <record><control><sourceid>crossref_sprin</sourceid><recordid>TN_cdi_crossref_primary_10_1134_S1087659614050022</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_1134_S1087659614050022</sourcerecordid><originalsourceid>FETCH-LOGICAL-c240t-b049d4cd4b7c6376c8bbc2fff359ed2d5bfff50ffa6bb24148ee6d6a2178f1da3</originalsourceid><addsrcrecordid>eNp9UMtKw0AUHUTBWv0Ad_MDqXcemSTLUnxBwUUquAvztClNJs4kiH_vtHUjgptzD-fcczlchG4JLAhh_K4mUBYirwThkANQeoZmRECZMcLezhNPdnbwL9FVjDsAqIqCz9BHPYZJj1OQezxYPe1bGdqxtRF7h2Xnw7D1U8TRdq32vUmrPkS8jIwtWG2PmIBj2Ztf6sYeZeMHa_BnO25xlF06PXXX6MLJfbQ3P3OOXh_uN6unbP3y-LxarjNNOYyZAl4Zrg1XhRasELpUSlPnHMsra6jJVeI5OCeFUpQTXlorjJCUFKUjRrI5Iqe7OvgYg3XNENpU4ash0Bx-1vz5WcrQUyam3f7dhmbnp9Cnmv-EvgGedG2q</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Structural peculiarities of amorphous semiconductors As33.3Se33.3S33.4 and As33.3Se33.3Te33.4 doped with samarium</title><source>SpringerNature Journals</source><creator>Alekberov, R. I. ; Isayeva, G. A. ; Mekhtiyeva, S. I. ; Isayev, A. I.</creator><creatorcontrib>Alekberov, R. I. ; Isayeva, G. A. ; Mekhtiyeva, S. I. ; Isayev, A. I.</creatorcontrib><description>The structure of chalcogenide vitreous semiconductors (CVSs) As
33.3
Se
33.3
S
33.4
and As
33.3
Se
33.3
Te
33.4
and the influence on them of samarium additives is studied using the technique of X-ray diffraction. The observed peculiarities of the diffraction picture are explained by the Elliott void-cluster model. The structural parameters of CVS materials As
33.3
Se
33.3
S
33.4
and As
33.3
Se
33.3
Te
33.4
with and without admixtures of samarium are determined.</description><identifier>ISSN: 1087-6596</identifier><identifier>EISSN: 1608-313X</identifier><identifier>DOI: 10.1134/S1087659614050022</identifier><language>eng</language><publisher>Moscow: Pleiades Publishing</publisher><subject>Ceramics ; Characterization and Evaluation of Materials ; Chemistry and Materials Science ; Composites ; Glass ; Materials Science ; Natural Materials ; Physical Chemistry</subject><ispartof>Glass physics and chemistry, 2014-09, Vol.40 (5), p.549-552</ispartof><rights>Pleiades Publishing, Ltd. 2014</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c240t-b049d4cd4b7c6376c8bbc2fff359ed2d5bfff50ffa6bb24148ee6d6a2178f1da3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1134/S1087659614050022$$EPDF$$P50$$Gspringer$$H</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1134/S1087659614050022$$EHTML$$P50$$Gspringer$$H</linktohtml><link.rule.ids>315,781,785,27929,27930,41493,42562,51324</link.rule.ids></links><search><creatorcontrib>Alekberov, R. I.</creatorcontrib><creatorcontrib>Isayeva, G. A.</creatorcontrib><creatorcontrib>Mekhtiyeva, S. I.</creatorcontrib><creatorcontrib>Isayev, A. I.</creatorcontrib><title>Structural peculiarities of amorphous semiconductors As33.3Se33.3S33.4 and As33.3Se33.3Te33.4 doped with samarium</title><title>Glass physics and chemistry</title><addtitle>Glass Phys Chem</addtitle><description>The structure of chalcogenide vitreous semiconductors (CVSs) As
33.3
Se
33.3
S
33.4
and As
33.3
Se
33.3
Te
33.4
and the influence on them of samarium additives is studied using the technique of X-ray diffraction. The observed peculiarities of the diffraction picture are explained by the Elliott void-cluster model. The structural parameters of CVS materials As
33.3
Se
33.3
S
33.4
and As
33.3
Se
33.3
Te
33.4
with and without admixtures of samarium are determined.</description><subject>Ceramics</subject><subject>Characterization and Evaluation of Materials</subject><subject>Chemistry and Materials Science</subject><subject>Composites</subject><subject>Glass</subject><subject>Materials Science</subject><subject>Natural Materials</subject><subject>Physical Chemistry</subject><issn>1087-6596</issn><issn>1608-313X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2014</creationdate><recordtype>article</recordtype><recordid>eNp9UMtKw0AUHUTBWv0Ad_MDqXcemSTLUnxBwUUquAvztClNJs4kiH_vtHUjgptzD-fcczlchG4JLAhh_K4mUBYirwThkANQeoZmRECZMcLezhNPdnbwL9FVjDsAqIqCz9BHPYZJj1OQezxYPe1bGdqxtRF7h2Xnw7D1U8TRdq32vUmrPkS8jIwtWG2PmIBj2Ztf6sYeZeMHa_BnO25xlF06PXXX6MLJfbQ3P3OOXh_uN6unbP3y-LxarjNNOYyZAl4Zrg1XhRasELpUSlPnHMsra6jJVeI5OCeFUpQTXlorjJCUFKUjRrI5Iqe7OvgYg3XNENpU4ash0Bx-1vz5WcrQUyam3f7dhmbnp9Cnmv-EvgGedG2q</recordid><startdate>20140901</startdate><enddate>20140901</enddate><creator>Alekberov, R. I.</creator><creator>Isayeva, G. A.</creator><creator>Mekhtiyeva, S. I.</creator><creator>Isayev, A. I.</creator><general>Pleiades Publishing</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20140901</creationdate><title>Structural peculiarities of amorphous semiconductors As33.3Se33.3S33.4 and As33.3Se33.3Te33.4 doped with samarium</title><author>Alekberov, R. I. ; Isayeva, G. A. ; Mekhtiyeva, S. I. ; Isayev, A. I.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c240t-b049d4cd4b7c6376c8bbc2fff359ed2d5bfff50ffa6bb24148ee6d6a2178f1da3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2014</creationdate><topic>Ceramics</topic><topic>Characterization and Evaluation of Materials</topic><topic>Chemistry and Materials Science</topic><topic>Composites</topic><topic>Glass</topic><topic>Materials Science</topic><topic>Natural Materials</topic><topic>Physical Chemistry</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Alekberov, R. I.</creatorcontrib><creatorcontrib>Isayeva, G. A.</creatorcontrib><creatorcontrib>Mekhtiyeva, S. I.</creatorcontrib><creatorcontrib>Isayev, A. I.</creatorcontrib><collection>CrossRef</collection><jtitle>Glass physics and chemistry</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Alekberov, R. I.</au><au>Isayeva, G. A.</au><au>Mekhtiyeva, S. I.</au><au>Isayev, A. I.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Structural peculiarities of amorphous semiconductors As33.3Se33.3S33.4 and As33.3Se33.3Te33.4 doped with samarium</atitle><jtitle>Glass physics and chemistry</jtitle><stitle>Glass Phys Chem</stitle><date>2014-09-01</date><risdate>2014</risdate><volume>40</volume><issue>5</issue><spage>549</spage><epage>552</epage><pages>549-552</pages><issn>1087-6596</issn><eissn>1608-313X</eissn><abstract>The structure of chalcogenide vitreous semiconductors (CVSs) As
33.3
Se
33.3
S
33.4
and As
33.3
Se
33.3
Te
33.4
and the influence on them of samarium additives is studied using the technique of X-ray diffraction. The observed peculiarities of the diffraction picture are explained by the Elliott void-cluster model. The structural parameters of CVS materials As
33.3
Se
33.3
S
33.4
and As
33.3
Se
33.3
Te
33.4
with and without admixtures of samarium are determined.</abstract><cop>Moscow</cop><pub>Pleiades Publishing</pub><doi>10.1134/S1087659614050022</doi><tpages>4</tpages></addata></record> |
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| identifier | ISSN: 1087-6596 |
| ispartof | Glass physics and chemistry, 2014-09, Vol.40 (5), p.549-552 |
| issn | 1087-6596 1608-313X |
| language | eng |
| recordid | cdi_crossref_primary_10_1134_S1087659614050022 |
| source | SpringerNature Journals |
| subjects | Ceramics Characterization and Evaluation of Materials Chemistry and Materials Science Composites Glass Materials Science Natural Materials Physical Chemistry |
| title | Structural peculiarities of amorphous semiconductors As33.3Se33.3S33.4 and As33.3Se33.3Te33.4 doped with samarium |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-15T01%3A51%3A58IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref_sprin&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Structural%20peculiarities%20of%20amorphous%20semiconductors%20As33.3Se33.3S33.4%20and%20As33.3Se33.3Te33.4%20doped%20with%20samarium&rft.jtitle=Glass%20physics%20and%20chemistry&rft.au=Alekberov,%20R.%20I.&rft.date=2014-09-01&rft.volume=40&rft.issue=5&rft.spage=549&rft.epage=552&rft.pages=549-552&rft.issn=1087-6596&rft.eissn=1608-313X&rft_id=info:doi/10.1134/S1087659614050022&rft_dat=%3Ccrossref_sprin%3E10_1134_S1087659614050022%3C/crossref_sprin%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |