Structure and Surface Morphology of Cd1 −x(Mn, Fe)xSe Epitaxial Films

The optimal conditions (υ к = 8−9 Å/s; Т п = 673 K) to obtain structurally perfect (W 1/2 = 100″−140″) Cd 1 − x (Mn, Fe) x Se epitaxial films in the (111) plane are determined. The structure and surface morphology of the epitaxial films are studied. It is established that in Cd 1 − x (Mn, Fe) x Se...

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Veröffentlicht in:	Surface investigation, x-ray, synchrotron and neutron techniques x-ray, synchrotron and neutron techniques, 2019-11, Vol.13 (6), p.1083-1085
Hauptverfasser:	Nuriyev, I. R., Mehrabova, M. A., Nazarov, A. M., Hasanov, N. H., Sadigov, R. M., Farzaliyev, S. S., Farajov, N. V.
Format:	Artikel
Sprache:	eng
Schlagworte:	Chemistry and Materials Science Materials Science Surfaces and Interfaces Thin Films
Online-Zugang:	Volltext
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Zusammenfassung:	The optimal conditions (υ к = 8−9 Å/s; Т п = 673 K) to obtain structurally perfect (W 1/2 = 100″−140″) Cd 1 − x (Mn, Fe) x Se epitaxial films in the (111) plane are determined. The structure and surface morphology of the epitaxial films are studied. It is established that in Cd 1 − x (Mn, Fe) x Se thin films, unlike bulk samples, the sphalerite structure with the lattice parameter a = 6.05 Å is formed. Using an additional source of Se vapor during growth, Cd 1 − x (Mn, Fe) x Se epitaxial films with a clean, smooth surface are obtained.
ISSN:	1027-4510 1819-7094
DOI:	10.1134/S1027451019060168