Thermally stimulated electromagnetic-field spectra in planar structures of complex composition: I. Nonradiative fields

It is demonstrated that a wealth of unambiguous information on the details of the atomic-lattice dynamics of solid-solution films can be acquired from a spectral study of the resonance features of thermal fields in immediate proximity to the planar-structure surface. The calculated spectral densities of the p - and s -polarized states of the nonradiative component of thermal fields in a plane-layered (or Cd x Zn 1 − x Te solid solution film-on-metal substrate) system are compared using the refraction additivity principle. The spectral densities are calculated for different impurity concentrations and thicknesses of the film and various distances from the structure surface.