Scanning near field microscope with a carbon nanotube as a probe

The possibility of investigating a nanomaterial structure using a near field scanning microscope with a carbon nanotube, used as a microprobe, is demonstrated.

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Veröffentlicht in:	Surface investigation, x-ray, synchrotron and neutron techniques x-ray, synchrotron and neutron techniques, 2011-12, Vol.5 (6), p.1168-1172
Hauptverfasser:	Kolerov, A. N., Onishchenko, D. V.
Format:	Artikel
Sprache:	eng
Schlagworte:	Chemistry and Materials Science Materials Science Surfaces and Interfaces Thin Films
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creator	Kolerov, A. N. Onishchenko, D. V.
description	The possibility of investigating a nanomaterial structure using a near field scanning microscope with a carbon nanotube, used as a microprobe, is demonstrated.
doi_str_mv	10.1134/S102745101112007X
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source	Springer Online Journals
subjects	Chemistry and Materials Science Materials Science Surfaces and Interfaces Thin Films
title	Scanning near field microscope with a carbon nanotube as a probe
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