Scanning near field microscope with a carbon nanotube as a probe

The possibility of investigating a nanomaterial structure using a near field scanning microscope with a carbon nanotube, used as a microprobe, is demonstrated.

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Bibliographische Detailangaben
Veröffentlicht in:	Surface investigation, x-ray, synchrotron and neutron techniques x-ray, synchrotron and neutron techniques, 2011-12, Vol.5 (6), p.1168-1172
Hauptverfasser:	Kolerov, A. N., Onishchenko, D. V.
Format:	Artikel
Sprache:	eng
Schlagworte:	Chemistry and Materials Science Materials Science Surfaces and Interfaces Thin Films
Online-Zugang:	Volltext
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Beschreibung
Zusammenfassung:	The possibility of investigating a nanomaterial structure using a near field scanning microscope with a carbon nanotube, used as a microprobe, is demonstrated.
ISSN:	1027-4510 1819-7094
DOI:	10.1134/S102745101112007X