Growth and study of ultrathin insulating SiO2 and MgO layers on the ferromagnetic electrode surface

In this paper, we present the experimental results on the application of the pulsed laser deposition (PLD) method to form functional SiO 2 and MgO layers in contact with Fe 3 Si and Fe ferromagnetic electrodes In situ X-ray photoelectron spectroscopy and low-energy ion scattering spectroscopy, in si...

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Veröffentlicht in:	Surface investigation, x-ray, synchrotron and neutron techniques x-ray, synchrotron and neutron techniques, 2009-04, Vol.3 (2), p.173-178
Hauptverfasser:	Zenkevich, A. V., Lebedinskii, Yu. Yu, Goikhman, A. Yu, Nevolin, V. N., Chernykh, P. N., Kulikauskas, V. S., Mantovan, R., Fanciulli, M.
Format:	Artikel
Sprache:	eng
Schlagworte:	2008 Chemistry and Materials Science Materials Science Moscow Moscow State University Proceedings of the XXXVIII International Conference on Physics of Interaction of Charged Particles with Crystals (Skobeltsyn Institute of Nuclear Physics Russia Surfaces and Interfaces Thin Films
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Beschreibung
Zusammenfassung:	In this paper, we present the experimental results on the application of the pulsed laser deposition (PLD) method to form functional SiO 2 and MgO layers in contact with Fe 3 Si and Fe ferromagnetic electrodes In situ X-ray photoelectron spectroscopy and low-energy ion scattering spectroscopy, in situ conversion electron Mössbauer spectroscopy and Rutherford backscattering and channeling of light ions were used to study the structural properties and morphology of formed ultrathin SiO 2 and MgO layers, as well as the chemical and phase composition of Fe 3 Si/SiO 2 and Fe/MgO interfaces.
ISSN:	1027-4510 1819-7094
DOI:	10.1134/S1027451009020013