Current-voltage behavior of silicon containing nanoclusters of manganese atoms

Using current-voltage measurements at varied temperature, incident light intensity, and illumination wavelength, we have determined the energy level spectrum of a multiply charged cluster of manganese atoms in silicon. The results demonstrate that such clusters produce a whole spectrum of energy lev...

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Veröffentlicht in:Inorganic materials 2014-04, Vol.50 (4), p.325-329
Hauptverfasser: Bakhadyrkhanov, M. K., Isamov, S. B., Zikrillaev, N. F.
Format: Artikel
Sprache:eng
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Zusammenfassung:Using current-voltage measurements at varied temperature, incident light intensity, and illumination wavelength, we have determined the energy level spectrum of a multiply charged cluster of manganese atoms in silicon. The results demonstrate that such clusters produce a whole spectrum of energy levels in the interval Δ E = 0.2–0.46 eV from the valence band top. The energy levels in this interval are distributed exponentially.
ISSN:0020-1685
1608-3172
DOI:10.1134/S0020168514040025