Imaging Traps in Oxide Semiconductors with the Aid of Thermostimulated Electron Emission
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| Veröffentlicht in: | Technical physics letters 2005, Vol.31 (7), p.600 |
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| Format: | Artikel |
| Sprache: | eng |
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| container_issue | 7 |
| container_start_page | 600 |
| container_title | Technical physics letters |
| container_volume | 31 |
| creator | Nagornykh, S. N. |
| description | |
| doi_str_mv | 10.1134/1.2001066 |
| format | Article |
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| fulltext | fulltext |
| identifier | ISSN: 1063-7850 |
| ispartof | Technical physics letters, 2005, Vol.31 (7), p.600 |
| issn | 1063-7850 |
| language | eng |
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| source | SpringerLink Journals - AutoHoldings |
| title | Imaging Traps in Oxide Semiconductors with the Aid of Thermostimulated Electron Emission |
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