Characteristics of the formation of radiation defects in silicon structures

Characteristics of the formation of radiation defects in silicon structures

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Veröffentlicht in:Technical physics 1999-01, Vol.44 (1), p.110-112
Hauptverfasser: Makhkamov, Sh, Tursunov, N. A., Ashurov, M., Saidov, R. P., Martynchenko, S. V.
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container_title Technical physics
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creator Makhkamov, Sh
Tursunov, N. A.
Ashurov, M.
Saidov, R. P.
Martynchenko, S. V.
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title Characteristics of the formation of radiation defects in silicon structures
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