Investigation of the chemical state of copper in Cu/SiO2 composite films by x-ray photoelectron spectroscopy
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| Veröffentlicht in: | Physics of the solid state 1997-10, Vol.39 (10), p.1691-1695 |
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| container_end_page | 1695 |
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| container_issue | 10 |
| container_start_page | 1691 |
| container_title | Physics of the solid state |
| container_volume | 39 |
| creator | Gurevich, S. A. Zaraiskaya, T. A. Konnikov, S. G. Mikushkin, V. M. Nikonov, S. Yu Sitnikova, A. A. Sysoev, S. E. Khorenko, V. V. Shnitov, V. V. Gordeev, Yu. S. |
| description | |
| doi_str_mv | 10.1134/1.1130141 |
| format | Article |
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| ispartof | Physics of the solid state, 1997-10, Vol.39 (10), p.1691-1695 |
| issn | 1063-7834 1090-6460 |
| language | eng |
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| title | Investigation of the chemical state of copper in Cu/SiO2 composite films by x-ray photoelectron spectroscopy |
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