Source localization with three-dimensional sound intensity probe with high precision

When an array module measuring three-dimensional sound intensity is employed for detecting the sound source, a compact space usage and small number of sensors are advantageous than the other source localization methods. However, because of severe bias errors, it has not been popular. We analyze the...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:The Journal of the Acoustical Society of America 2017-05, Vol.141 (5), p.3587-3587
Hauptverfasser: Ih, Jeong-Guon, Jung, In-Jee, Woo, Jung-Han
Format: Artikel
Sprache:eng
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:When an array module measuring three-dimensional sound intensity is employed for detecting the sound source, a compact space usage and small number of sensors are advantageous than the other source localization methods. However, because of severe bias errors, it has not been popular. We analyze the major sources of bias estimation error and seek for the compensation method. Spectral bias error is due to the reflected signal from the environment, which is proportional to the difference of distance between direct and reflective paths. Spatial bias error is due to the inhomogeneous directivity of the intensity module stemming from discrete arrangement of sensors on the hypothetical sphere surrounding sensors. Simulation with changing the source direction by 1 deg. in spherical angle can generate an error map for all incidence angles. A measurement is conducted using a tetrahedral intensity module with 30 mm spacing for the compensation of errors. Low pass filtering of the cross spectral density function is used for the spectral bias error, and spherical error map is used for the directional bias error. By compensating such bias errors, it is shown that the localization errors of all bearing angles are less than 1° in an anechoic chamber when kd
ISSN:0001-4966
1520-8524
DOI:10.1121/1.4987659