Stoichiometric indium oxide thin films prepared by pulsed laser deposition in pure inert background gas

We have observed a drastic change in the properties of indium oxide ( In 2 O 3 ) thin films prepared by pulsed laser deposition in a pure helium (He) background gas on unheated glass substrates. At high He pressures above 1.0 Torr, transparent crystalline In 2 O 3 films could be prepared, even thoug...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Journal of vacuum science & technology. A, Vacuum, surfaces, and films Vacuum, surfaces, and films, 2000-01, Vol.18 (1), p.83-86
Hauptverfasser: Yamada, Yuka, Suzuki, Nobuyasu, Makino, Toshiharu, Yoshida, Takehito
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:We have observed a drastic change in the properties of indium oxide ( In 2 O 3 ) thin films prepared by pulsed laser deposition in a pure helium (He) background gas on unheated glass substrates. At high He pressures above 1.0 Torr, transparent crystalline In 2 O 3 films could be prepared, even though the deposition was carried out without the introduction of oxygen gas and substrate heating. At lower He pressures, blackish opaque films were deposited. These results can be accounted for by the inert background gas effects, which cause spatial confinement of the ablated species in the high-pressure and high-temperature region. Facilitated oxidation in this region would suppress oxygen deficiency in the deposited films.
ISSN:0734-2101
1520-8559
DOI:10.1116/1.582122