On Cross Sections for Electron Impact Ionization of Multicharged Ions

On Cross Sections for Electron Impact Ionization of Multicharged Ions

Electron impact ionization cross sections calculated by means of two semi-empirical expressions (Lotz, Seaton), a semiclassical model (Burgess: "ECIP"), and a simple quantum approximation (Seaton) are compared with results of more elaborate quantum (Coulomb-Born) calculations and measureme...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:IEEE transactions on plasma science 1978-01, Vol.6 (1), p.71-75
1. Verfasser: Barfield, W. D.
Format: Artikel
Sprache:eng
Schlagworte:
Corona
Current measurement
Electrons
Impact ionization
Integrated circuit modeling
Interference
Iron
Laboratories
Plasma devices
Tokamaks
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:Electron impact ionization cross sections calculated by means of two semi-empirical expressions (Lotz, Seaton), a semiclassical model (Burgess: "ECIP"), and a simple quantum approximation (Seaton) are compared with results of more elaborate quantum (Coulomb-Born) calculations and measurements for several multicharged ions (N2+, Mg2+, C3+, O3+, C5+, O5+, Fe14+). While in some cases the comparisons are not definitive, the simple formula of Lotz appears to represent the C-B and experimental results more consistently than the other methods.
ISSN:0093-3813
1939-9375
DOI:10.1109/TPS.1978.4317088