Mathematical Modeling and Analysis of a Very Low Frequency HV Test System

This paper presents a new type of very low frequency (VLF) high-voltage test system for on-site cable tests up to 200 kV rms. The VLF system is based on a so called differential resonance technology (DRT), which enables a light-weight and compact construction of cable test systems. A mathematical mo...

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Veröffentlicht in:IEEE transactions on power electronics 2014-11, Vol.29 (11), p.5784-5794
Hauptverfasser: Eberharter, Stefan, Kemmetmuller, Wolfgang, Kugi, Andreas
Format: Artikel
Sprache:eng
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Zusammenfassung:This paper presents a new type of very low frequency (VLF) high-voltage test system for on-site cable tests up to 200 kV rms. The VLF system is based on a so called differential resonance technology (DRT), which enables a light-weight and compact construction of cable test systems. A mathematical model of the test system is presented, which is used for a detailed analysis and optimization of the DRT system. Measurement results on a prototype for 200 kV rms and loads up to 0.75 μF are used to validate the mathematical model and to show the feasibility of the test system.
ISSN:0885-8993
1941-0107
DOI:10.1109/TPEL.2014.2299293