Strong Correlation Between Experiment and Simulation for Two-Photon Absorption Induced Carrier Generation

This correspondence comments on the correlation between measured and simulated charge collection in two diode structures presented in [1]. In [1], results from pulsed-laser-induced charge deposition via two-photon absorption revealed reasonable correlation between experimental data and simulations i...

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Veröffentlicht in:	IEEE transactions on nuclear science 2017-05, Vol.64 (5), p.1133-1136
Hauptverfasser:	Hales, Joel M., Roche, Nicolas J.-H, Khachatrian, Ani, Mcmorrow, Dale, Buchner, Stephen, Warner, Jeffrey, Turowski, Marek, Lilja, Klas, Hooten, Nicholas C., En Xia Zhang, Reed, Robert A., Schrimpf, Ronald D.
Format:	Artikel
Sprache:	eng
Schlagworte:	Absorption Calibration Charge deposition Charge simulation Computer simulation Correlation Correlation analysis Energy Energy measurement Laser beams Measurement by laser beam Meters Numerical prediction Photodiodes Photon absorption Propagation Pulse measurements Silicon single-event effect (SEE) single-event upset (SEU) two-photon absorption (TPA)
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