Strong Correlation Between Experiment and Simulation for Two-Photon Absorption Induced Carrier Generation

This correspondence comments on the correlation between measured and simulated charge collection in two diode structures presented in [1]. In [1], results from pulsed-laser-induced charge deposition via two-photon absorption revealed reasonable correlation between experimental data and simulations i...

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Veröffentlicht in:IEEE transactions on nuclear science 2017-05, Vol.64 (5), p.1133-1136
Hauptverfasser: Hales, Joel M., Roche, Nicolas J.-H, Khachatrian, Ani, Mcmorrow, Dale, Buchner, Stephen, Warner, Jeffrey, Turowski, Marek, Lilja, Klas, Hooten, Nicholas C., En Xia Zhang, Reed, Robert A., Schrimpf, Ronald D.
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Sprache:eng
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Zusammenfassung:This correspondence comments on the correlation between measured and simulated charge collection in two diode structures presented in [1]. In [1], results from pulsed-laser-induced charge deposition via two-photon absorption revealed reasonable correlation between experimental data and simulations in some aspects but showed lack of correlation in terms of the measured and predicted magnitudes of the collected charge. The source of this poor agreement has recently been determined, and is attributed to an incorrect pulse energy calibration used for those experiments. With the proper energy calibration applied, the agreement between simulation and experiment is nearly quantitative for all observables in both devices. These results significantly strengthen the validity of the nonlinear optical beam propagation method numerical approach for accurately predicting pulsed-laser-induced charge deposition.
ISSN:0018-9499
1558-1578
DOI:10.1109/TNS.2017.2686010