Ion Beam Induced Charge Studies of CdZnTe Grown by Modified Vertical Bridgman Method

Ion beam induced charge (IBIC) and time resolved digital IBIC techniques have been used to map the electronic properties of CdZnTe manufactured by Yinnel Tech Inc. The 2 MeV proton scanning microbeam at the University of Surrey Ion Beam Centre was used to map the charge transport properties of both...

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Veröffentlicht in:	IEEE transactions on nuclear science 2008-12, Vol.55 (6), p.3741-3745
Hauptverfasser:	Veale, M.C., Sellin, P.J., Parkin, J., Lohstroh, A., Davies, A.W., Seller, P.
Format:	Artikel
Sprache:	eng
Schlagworte:	Bridgman method Cadmium zinc tellurides CdZnTe Charge Charge carrier processes Charge transport charge transport properties Crystal growth Detectors digital pulse processing IBIC Ion beams Microorganisms Particle beams Preamplifiers Protons Pulse amplifiers Pulse measurements Temperature trapping Variability Voltage
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