SEL Induced Latent Damage, Testing, and Evaluation

SEL Induced Latent Damage, Testing, and Evaluation

We describe a methodology for evaluating and screening SEL susceptible devices for latent damage. Experimental data and modeling are presented to demonstrate the approach on actual devices

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:IEEE transactions on nuclear science 2006-12, Vol.53 (6), p.3153-3157
Hauptverfasser: Layton, P., Kniffin, S., Guertin, S., Swift, G., Buchner, S.
Format: Artikel
Sprache:eng
Schlagworte:
Characterization
Damage
Devices
Laboratories
Laser theory
latent damage
Life testing
Mathematical models
Methodology
NASA
Performance evaluation
Production
Propulsion
Screening
SDRAM
SEL
Space technology
Temperature
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:We describe a methodology for evaluating and screening SEL susceptible devices for latent damage. Experimental data and modeling are presented to demonstrate the approach on actual devices
ISSN:0018-9499
1558-1578
DOI:10.1109/TNS.2006.886235