Single Event-Induced Instability in Linear Voltage Regulators

Single Event-Induced Instability in Linear Voltage Regulators

SET-induced oscillations were measured on a stable linear-regulator that uses the LM124 op-amp in its regulation block. Simulations showed that single events act as stimuli that initiate a large-signal oscillation in the LM124 differential amplifier and compensation capacitor path. Laser testing val...

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Veröffentlicht in:IEEE transactions on nuclear science 2006-12, Vol.53 (6), p.3506-3511
Hauptverfasser: Adell, P.C., Witulski, A.F., Schrimpf, R.D., Marec, R., Pouget, V., Calvel, P., Bezerra, F.
Format: Artikel
Sprache:eng
Schlagworte:
Analog integrated circuits
Application specific integrated circuits
Blocking
Capacitors
Circuit simulation
Circuit testing
Compensation
Control
Electronics
Engineering Sciences
Frequency measurement
Laboratories
Lasers
Linear voltage regulator
macro-model
Operational amplifiers
Oscillations
Regulators
Simulation
Single Event Oscillation
Stimuli
Voltage
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Beschreibung
Zusammenfassung:SET-induced oscillations were measured on a stable linear-regulator that uses the LM124 op-amp in its regulation block. Simulations showed that single events act as stimuli that initiate a large-signal oscillation in the LM124 differential amplifier and compensation capacitor path. Laser testing validated the analysis and confirmed that transistors connected to the compensation capacitor are the most vulnerable
ISSN:0018-9499
1558-1578
DOI:10.1109/TNS.2006.886214