Analysis of Trapped Image Guides Using Effective Dielectric Constant and Surface Impedances

Analysis of Trapped Image Guides Using Effective Dielectric Constant and Surface Impedances

A method has been introduced to accurately predict dispersion characteristics of the trapped image guide. Numerical results agreed much better with experimental results than those previously calculated by a simple effective dielectric constant (EDC) approach especially at the low frequency end.

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Bibliographische Detailangaben
Veröffentlicht in:IEEE transactions on microwave theory and techniques 1982-12, Vol.30 (12), p.2163-2166
Hauptverfasser: Wen-Biao Zhou, Itoh, T.
Format: Artikel
Sprache:eng
Schlagworte:
Dielectric constant
Dielectric losses
Eigenvalues and eigenfunctions
Frequency
Image analysis
Region 1
Region 5
Slabs
Surface impedance
Waveguide junctions
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Beschreibung
Zusammenfassung:A method has been introduced to accurately predict dispersion characteristics of the trapped image guide. Numerical results agreed much better with experimental results than those previously calculated by a simple effective dielectric constant (EDC) approach especially at the low frequency end.
ISSN:0018-9480
1557-9670
DOI:10.1109/TMTT.1982.1131401