Microrobot System for Automatic Nanohandling Inside a Scanning Electron Microscope
In this paper, current research work on the development of an automated nano handling station in a scanning electron microscope (SEM) is presented. An experimental setup is described, in which two mobile microrobots cooperate in the vacuum chamber of an SEM. The robots are positioned by a closed-loo...
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Veröffentlicht in: | IEEE/ASME transactions on mechatronics 2007-06, Vol.12 (3), p.244-252 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | In this paper, current research work on the development of an automated nano handling station in a scanning electron microscope (SEM) is presented. An experimental setup is described, in which two mobile microrobots cooperate in the vacuum chamber of an SEM. The robots are positioned by a closed-loop controller with sensor data, which is provided by three charge-coupled device cameras and the SEM. Continuous pose estimation is carried out by processing noisy SEM images in real time. To enable the automation of complex tasks, a client-server control system that can integrate various microrobots and sensors is introduced. Finally, the overall system is evaluated by automatic handling of transmission electron microscope lamellae. |
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ISSN: | 1083-4435 1941-014X |
DOI: | 10.1109/TMECH.2007.897252 |