Microrobot System for Automatic Nanohandling Inside a Scanning Electron Microscope

In this paper, current research work on the development of an automated nano handling station in a scanning electron microscope (SEM) is presented. An experimental setup is described, in which two mobile microrobots cooperate in the vacuum chamber of an SEM. The robots are positioned by a closed-loo...

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Veröffentlicht in:IEEE/ASME transactions on mechatronics 2007-06, Vol.12 (3), p.244-252
Hauptverfasser: Fatikow, S., Wich, T., Hulsen, H., Sievers, T., Jahnisch, M.
Format: Artikel
Sprache:eng
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Zusammenfassung:In this paper, current research work on the development of an automated nano handling station in a scanning electron microscope (SEM) is presented. An experimental setup is described, in which two mobile microrobots cooperate in the vacuum chamber of an SEM. The robots are positioned by a closed-loop controller with sensor data, which is provided by three charge-coupled device cameras and the SEM. Continuous pose estimation is carried out by processing noisy SEM images in real time. To enable the automation of complex tasks, a client-server control system that can integrate various microrobots and sensors is introduced. Finally, the overall system is evaluated by automatic handling of transmission electron microscope lamellae.
ISSN:1083-4435
1941-014X
DOI:10.1109/TMECH.2007.897252