A Compressive Learning-based Scheme for Nonlinear Reconstructions in Electrical Impedance Tomography

Recently, the application of deep learning techniques has provided significant advances in solving nonlinear electrical impedance tomography (EIT) problems. However, when state-of-the-art performance is pushed further, these models become bigger and more difficult to use in computation-limited scena...

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Veröffentlicht in:IEEE transactions on instrumentation and measurement 2024-01, Vol.73, p.1-1
Hauptverfasser: Zong, Zheng, Wang, Yusong, He, Siyuan, Zhu, Yong-Jian, Wei, Zhun
Format: Artikel
Sprache:eng
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Zusammenfassung:Recently, the application of deep learning techniques has provided significant advances in solving nonlinear electrical impedance tomography (EIT) problems. However, when state-of-the-art performance is pushed further, these models become bigger and more difficult to use in computation-limited scenarios. In order to reduce the computational overhead and memory footprint, a EIT-specific compressive learning-based scheme (CLS) is proposed. The CLS is implemented in two-stage strategy. Firstly, a non-iterative inverse operator, named dominant current based method, is introduced to map the EIT measurement data to approximate conductivity images. Secondly, a wavelet-based compressive CNN with separable convolution is learned by rough image and target image pairs, where a custom loss function with mixed structural similarity (SSIM) metrics is proposed for training. Our proposed CLS has only 0.26% trainable parameters and 0.61% network size of benchmark methods, including the dominant current deep learning scheme (DC-DLS) and the deep D-bar method. Nevertheless, extensive numerical and practical experiments demonstrate that it achieves a comparable level of reconstruction quality when compared to these benchmark methods. As a learning-based approach, it also exhibiters advantages over traditional iterative methods, such as the subspace optimization method (SOM). It is anticipated that the suggested CLS would encourage other compression researches and applications in EIT.
ISSN:0018-9456
1557-9662
DOI:10.1109/TIM.2023.3346500