Voltage Dependence of the Reference System in Medium- and High-Voltage Current Transformer Calibrations

A sampling current ratio measurement system has been developed to calibrate the voltage dependence of ratio error and phase displacement of current transformers (CTs) used for medium-voltage (MV) and high-voltage (HV) applications. The influence of voltage-induced leakage current on the apparent rat...

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Veröffentlicht in:IEEE transactions on instrumentation and measurement 2021, Vol.70, p.1-8
Hauptverfasser: van den Brom, Helko E., van Leeuwen, Ronald, Rietveld, Gert, Houtzager, Ernest
Format: Artikel
Sprache:eng
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Zusammenfassung:A sampling current ratio measurement system has been developed to calibrate the voltage dependence of ratio error and phase displacement of current transformers (CTs) used for medium-voltage (MV) and high-voltage (HV) applications. The influence of voltage-induced leakage current on the apparent ratio error and phase displacement of the reference circuit was unambiguously demonstrated using a novel measurement method. Measurement results for voltages up to 24 kV show that the observed leakage current is purely capacitive and caused by the shielded cable capacitance of the HV cable used to feed the current. The maximum ratio error and phase displacement were found to be about 100 parts in 10 6 and 100~\mu rad for the smallest current of 100 A used for these investigations. Since these values scale linearly with the applied voltage and inversely proportional with current, the assumption of negligible voltage dependence used in other reference systems presented in literature is questionable. Using the corrected reference circuit, a commercial class 0.2S MV CT with 2500-A nominal current was calibrated at voltage levels up to 24 kV. The voltage dependence of ratio error and phase displacement for primary currents up to 500 A was demonstrated to be capacitive as well, with a maximum impact on the current ratio of almost 0.9% for a primary current of 100 A (corresponding to 3.6% at 1% of nominal current). This value is beyond the limits of in-force standards, which emphasizes the necessity of implementing voltage dependence testing in those standards.
ISSN:0018-9456
1557-9662
DOI:10.1109/TIM.2021.3066167