Novel Method to Measure the Capacitive Matching of A/D Converter Based on Successive Approximation
Analog-to-digital converters (ADCs) based on successive approximation are widely used in many applications. Systems with price pressure such as electrical motor drives often use lower resolution 12-bit ADCs instead of the 16-bit high grades, as the price increases exponentially with the resolution....
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| Veröffentlicht in: | IEEE transactions on instrumentation and measurement 2013-10, Vol.62 (10), p.2652-2658 |
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| container_title | IEEE transactions on instrumentation and measurement |
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| creator | Ohnhaeuser, Frank Reinhold, Michael Wickmann, Andreas Allinger, Martin |
| description | Analog-to-digital converters (ADCs) based on successive approximation are widely used in many applications. Systems with price pressure such as electrical motor drives often use lower resolution 12-bit ADCs instead of the 16-bit high grades, as the price increases exponentially with the resolution. This is caused by the essential test costs. Production test times with up to 60 s are common. Reducing the test time is therefore an essential area of research and would enable affordable end products with higher accuracy. Optimizations such as real time histogramming reduced the production test already to 24 s. Now, the limiting factors are the calibration process (trimming) and the linearity test. This paper presents a novel idea to reduce the trim time by a factor of 20 without the loss of accuracy. The method was implemented on silicon. Measurement results are presented. |
| doi_str_mv | 10.1109/TIM.2013.2261616 |
| format | Article |
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Measurement results are presented.</description><subject>Accuracy</subject><subject>Analog-to-digital converters (ADCs)</subject><subject>Approximation methods</subject><subject>capacitance measurement</subject><subject>capacitor switching</subject><subject>Capacitors</subject><subject>design for testability (DFT)</subject><subject>Electric potential</subject><subject>Error correction</subject><subject>mixed analog digital integrated circuits</subject><subject>semiconductor device testing</subject><subject>Switches</subject><subject>switching circuits</subject><subject>Transfer functions</subject><issn>0018-9456</issn><issn>1557-9662</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2013</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNo9kM1OwzAQhC0EEqVwR-LiF0hqx_HGPpbwV6mFA-UcOc6GBpU4st0K3p5UrdAeZg8zo9FHyC1nKedMz9aLVZoxLtIsAz7eGZlwKYtEA2TnZMIYV4nOJVySqxC-GGMF5MWE1K9uj1u6wrhxDY1u_EzYeaRxg7Q0g7Fd7PZIVybaTdd_UtfS-eyBlq7fo4_o6b0J2FDX0_edtRjCwT0fBu9-um8TO9dfk4vWbAPenHRKPp4e1-VLsnx7XpTzZWIzDjERuiiggVrWSoGEvEVsFLNKYCZqZXXbKm4lcKOYBqyt0YoZkE3OhKmLohFTwo691rsQPLbV4McJ_rfirDowqkZG1YFRdWI0Ru6OkQ4R_-0gM6EliD-ZK2Ml</recordid><startdate>20131001</startdate><enddate>20131001</enddate><creator>Ohnhaeuser, Frank</creator><creator>Reinhold, Michael</creator><creator>Wickmann, Andreas</creator><creator>Allinger, Martin</creator><general>IEEE</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20131001</creationdate><title>Novel Method to Measure the Capacitive Matching of A/D Converter Based on Successive Approximation</title><author>Ohnhaeuser, Frank ; Reinhold, Michael ; Wickmann, Andreas ; Allinger, Martin</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c216t-39776d6b5b886564feed80c83e23b8c9ff81c561a8096ebca980a65d403ab77d3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2013</creationdate><topic>Accuracy</topic><topic>Analog-to-digital converters (ADCs)</topic><topic>Approximation methods</topic><topic>capacitance measurement</topic><topic>capacitor switching</topic><topic>Capacitors</topic><topic>design for testability (DFT)</topic><topic>Electric potential</topic><topic>Error correction</topic><topic>mixed analog digital integrated circuits</topic><topic>semiconductor device testing</topic><topic>Switches</topic><topic>switching circuits</topic><topic>Transfer functions</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Ohnhaeuser, Frank</creatorcontrib><creatorcontrib>Reinhold, Michael</creatorcontrib><creatorcontrib>Wickmann, Andreas</creatorcontrib><creatorcontrib>Allinger, Martin</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><jtitle>IEEE transactions on instrumentation and measurement</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Ohnhaeuser, Frank</au><au>Reinhold, Michael</au><au>Wickmann, Andreas</au><au>Allinger, Martin</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Novel Method to Measure the Capacitive Matching of A/D Converter Based on Successive Approximation</atitle><jtitle>IEEE transactions on instrumentation and measurement</jtitle><stitle>TIM</stitle><date>2013-10-01</date><risdate>2013</risdate><volume>62</volume><issue>10</issue><spage>2652</spage><epage>2658</epage><pages>2652-2658</pages><issn>0018-9456</issn><eissn>1557-9662</eissn><coden>IEIMAO</coden><abstract>Analog-to-digital converters (ADCs) based on successive approximation are widely used in many applications. 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| subjects | Accuracy Analog-to-digital converters (ADCs) Approximation methods capacitance measurement capacitor switching Capacitors design for testability (DFT) Electric potential Error correction mixed analog digital integrated circuits semiconductor device testing Switches switching circuits Transfer functions |
| title | Novel Method to Measure the Capacitive Matching of A/D Converter Based on Successive Approximation |
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