Synthetic TDR Measurements for TEM and GTEM Cell Characterization

Synthetic TDR Measurements for TEM and GTEM Cell Characterization

This paper describes the main features of the time-domain reflectometry (TDR) measurement technique and, in particular, the TDR analysis performed using a proper operating mode of the vector network analyzer (VNA), which is called synthetic TDR. Furthermore, some results of reflection measurement, w...

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Veröffentlicht in:IEEE transactions on instrumentation and measurement 2007-04, Vol.56 (2), p.271-274
Hauptverfasser: Borsero, M., Vizio, G., Parena, D., Teppati, V.
Format: Artikel
Sprache:eng
Schlagworte:
Digital signal processing
Electromagnetic measurements
Electromagnetic reflection
Frequency measurement
Gigahertz transverse electromagnetic (GTEM)
Impedance
Impedance measurement
Instrumentation
Mathematical analysis
Networks
Oscilloscopes
Performance analysis
r eflection coefficient
Reflection
Reflectometry
TEM cells
Time domain analysis
time-domain reflectometry (TDR)
Transmission electron microscopy
transverse electromagnetic (TEM)
vector network analyzer (VNA)
Vectors (mathematics)
VNA measurements
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Zusammenfassung:This paper describes the main features of the time-domain reflectometry (TDR) measurement technique and, in particular, the TDR analysis performed using a proper operating mode of the vector network analyzer (VNA), which is called synthetic TDR. Furthermore, some results of reflection measurement, which aim to characterize the impedance behavior of transverse electromagnetic (TEM) and gigahertz TEM cells by means of a commercial VNA in time-domain mode, are presented
ISSN:0018-9456
1557-9662
DOI:10.1109/TIM.2007.890796