A New Method to Measure the Figure-of-Merit of Microwave Detector Diodes

A New Method to Measure the Figure-of-Merit of Microwave Detector Diodes

It is shown that the figure-of-merit of microwave detector diodes can be measured directly using a noise measurement technique based on digital Fourier analysis. This technique enables the operating conditions of these diodes to be optimized while an in situ part of an instrumentation system.

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Veröffentlicht in:IEEE transactions on instrumentation and measurement 1974-01, Vol.23 (1), p.102-103
Hauptverfasser: Cohn-Sfetcu, S., Buckmaster, H. A.
Format: Artikel
Sprache:eng
Schlagworte:
Breakdown voltage
Detectors
Diodes
Frequency conversion
Frequency measurement
Instruments
Microwave measurements
Microwave theory and techniques
Noise measurement
Signal to noise ratio
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Beschreibung
Zusammenfassung:It is shown that the figure-of-merit of microwave detector diodes can be measured directly using a noise measurement technique based on digital Fourier analysis. This technique enables the operating conditions of these diodes to be optimized while an in situ part of an instrumentation system.
ISSN:0018-9456
1557-9662
DOI:10.1109/TIM.1974.4314229