Automated Linear System Parameter Identification Using Successive Differentiation and its Application in Microprocessor Controlled C and Tan δ Measurement

A new algorithm is suggested for linear system parameter identification, which lends itself easily to implementation using microprocessors. The main feature of this algorithm is that it is based on the estimation of the values of the successive derivatives of the input and output variables. This new...

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Veröffentlicht in:	IEEE transactions on industrial electronics (1982) 1984-05, Vol.IE-31 (2), p.137-140
Hauptverfasser:	Selim, Hany, Girgis, Girgis A.
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Automatic control Capacitance measurement Computer science control theory systems Control systems Control theory. Systems Equations Exact sciences and technology Frequency Linear systems Loss measurement Microprocessors Modelling and identification Parameter estimation Transfer functions
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